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Statistical Aspects of Quality Control: Statistical Modeling and Decision Science

Autor Derman Cyrus, Sheldon M. Ross
en Limba Engleză Hardback – 20 noi 1996
On-line and off-line quality control are the two methods used to discern a products reliability of quality. Though they are disparate techniques, both methods are used to achieve the same result. This introductory textbook integrates the two techniques to present a wide coverage of statistical methods of quality control. The text is compact, stressing the key ideas and concepts rather than trying to cover each method in complete depth. Statistical Aspects of Quality Control is an excellent starting point for a student interested in learning more about the field of statistical quality control. References and suggested readings are included at the end of each chapter.

  • Presents statistical quality control in a compact fashion that stresses key ideas and concepts
  • Uses the concept of Average Run Length to compare the different control charts, such as Shewhart, moving average, and cusum
  • Introduces the Taguchi approach to quality design
  • Includes information on acceptance sampling
  • Concludes each chapter with final comments, references, and examples to illustrate the methods discussed
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Specificații

ISBN-13: 9780122100109
ISBN-10: 0122100107
Pagini: 200
Dimensiuni: 152 x 229 x 21 mm
Greutate: 0.5 kg
Editura: ELSEVIER SCIENCE
Seria Statistical Modeling and Decision Science


Public țintă

Students in statistics and business, Industrial Engineers, Operations Researchers, statisticians, Quality Engineers

Cuprins

Introduction.Elements of Probability.Statistical Inference.Off-Line Quality Control.Shewhart Control Charts.More General Control Charts.Sampling Inspection by Attributes.Sampling Inspection by Variables--A Loss FunctionApproach.Subject Index.

Recenzii

"The book is well written and easy to follow." --Enrique Del Castillo, University of Texas-Arlington, THE AMERICAN SATISTICIAN "...the book is useful to both statistician and nonstatistician audiences..." --Robert O'Donnell, Hewlett-Packard, TECHNOMETRICS