Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications Springer Series in Materials Science, nr. 85 Autor Stefan Rein 23 iun 2005 Hardback Preț: 1793.30 lei 2186.95 lei 6-8 săpt. -18%
Star Trek - Rezeptionsverhalten bei einem Fernsehphänomen Autor Stefan Rein 31 oct 2010 Paperback Preț: 75.56 lei Indisponibil temporar