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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings: Lecture Notes in Computer Science, cartea 10029

Editat de Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson
en Limba Engleză Paperback – 5 noi 2016
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 
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Specificații

ISBN-13: 9783319490540
ISBN-10: 3319490540
Pagini: 574
Ilustrații: XIII, 588 p. 167 illus.
Dimensiuni: 155 x 235 x 31 mm
Greutate: 0.84 kg
Ediția:1st ed. 2016
Editura: Springer International Publishing
Colecția Springer
Seriile Lecture Notes in Computer Science, Image Processing, Computer Vision, Pattern Recognition, and Graphics

Locul publicării:Cham, Switzerland

Cuprins

Dimensionality reduction.- Manifold learning and embedding methods.-Dissimilarity representations.- Graph-theoretic methods.- Model selection, classification and clustering.- Semi and fully supervised learning methods.- Shape analysis.- Spatio-temporal pattern recognition.- Structural matching.- Text and document analysis. 

Caracteristici

Includes supplementary material: sn.pub/extras