Surfaces and Interfaces I: Chemical and Physical Characteristics: Sagamore Army Materials Research Conference Proceedings
Editat de John Burkeen Limba Engleză Paperback – 27 dec 2012
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Specificații
ISBN-13: 9781468475166
ISBN-10: 1468475169
Pagini: 492
Ilustrații: X, 478 p. 166 illus.
Dimensiuni: 152 x 229 x 26 mm
Greutate: 0.65 kg
Ediția:Softcover reprint of the original 1st ed. 1967
Editura: Springer Us
Colecția Springer
Seria Sagamore Army Materials Research Conference Proceedings
Locul publicării:New York, NY, United States
ISBN-10: 1468475169
Pagini: 492
Ilustrații: X, 478 p. 166 illus.
Dimensiuni: 152 x 229 x 26 mm
Greutate: 0.65 kg
Ediția:Softcover reprint of the original 1st ed. 1967
Editura: Springer Us
Colecția Springer
Seria Sagamore Army Materials Research Conference Proceedings
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Session I Surfaces and Interfaces.- 1 Introduction to the Characteristics of Surfaces and Interfaces.- Session II Characterization of Surfaces: Part I.- 2 Techniques for Studying Clean Surfaces.- 3 Electron Optical Characterization of Metal Surfaces.- 4 Semiconductor Surfaces.- Session III Characterization of Surfaces: Part II.- 5 Electronic Surface States of Ionic Insulators.- 6 Crystallographic Anisotropy in the Surface Energy of Solids.- Session IV Adsorption and Adhesion.- 7 The Heterogeneity of Solid Substrates.- 8 Intermolecular and Interatomic Forces at Interfaces.- 9 Application of Recent Static Adhesion Data to the Adhesion Theory of Friction.- 10 The Similarities of Static and Kinetic Friction.- Session V Surface Kinetics.- 11 Surface Self-Diffusion in FCC and BCC Metals: A Comparison of Theory and Experiment.- 12 Recent Developments in Heterogeneous Nucleation from the Vapor Phase.- 13 Surface Energies from Transport Measurements.- 14 Oxidation Rate and Oxide Structural Defects.- 15 X-Ray Study of Thin Surface Layers.- Session VI Interfaces.- 16 On the Structure of Epitaxial Bicrystals.- 17 Initial Stages of Epitaxy and Interfacial Dislocations.- 18 Low-Energy-Electron Diffraction Study of the Epitaxy of Si on Si.- 19 Some Physical and Chemical Properties of Grain Boundaries.