The Physical Properties of Thin Metal Films
Editat de G.P. Zhigal'skii, Brian K. Jonesen Limba Engleză Hardback – 10 iul 2003
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Specificații
ISBN-13: 9780415283908
ISBN-10: 0415283906
Pagini: 230
Dimensiuni: 156 x 234 x 18 mm
Greutate: 0.48 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
ISBN-10: 0415283906
Pagini: 230
Dimensiuni: 156 x 234 x 18 mm
Greutate: 0.48 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Public țintă
Professional Practice & DevelopmentCuprins
Conduction in Discontinuous Films. Size-effects in Thin Metal Films. Internal Mechanical Stresses and Voids in Thin Metal Films. Electrical Noise in Thin Films and Thin-Film Structures. Non-linear Conduction and Non-Equilibrium Noise in Thin Films. Degradation Mechanisms in Thin Metal Films.
Descriere
Thin films of conducting materials, such as metals, alloys and semiconductors, are used in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors, and ohmic contacts. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments, and applications. This book will be an invaluable reference for graduate students, engineers, and scientists working in the electronics industry and fields of pure and applied science.