Electrical Atomic Force Microscopy for Nanoelectronics NanoScience and Technology Editat de Umberto Celano 25 aug 2020 Paperback Preț: 1114.21 lei 1358.78 lei 6-8 săpt. -18%
Metrology and Physical Mechanisms in New Generation Ionic Devices Springer Theses Autor Umberto Celano 24 iun 2016 Hardback Preț: 641.85 lei 755.13 lei 6-8 săpt. -15%