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Metrology and Physical Mechanisms in New Generation Ionic Devices de Umberto Celano

Metrology and Physical Mechanisms in New Generation Ionic Devices: Springer Theses

Autor Umberto Celano
en Limba Engleză Hardback – 24 iun 2016
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. 



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Specificații

ISBN-13: 9783319395302
ISBN-10: 3319395300
Pagini: 206
Ilustrații: XXIV, 175 p. 96 illus., 18 illus. in color.
Dimensiuni: 155 x 235 x 13 mm
Greutate: 0.46 kg
Ediția:1st ed. 2016
Editura: Springer International Publishing
Colecția Springer
Seria Springer Theses

Locul publicării:Cham, Switzerland

Cuprins

Introduction.- Filamentary-Based Resistive Switching.- Nanoscaled Electrical Characterization.- Conductive Filaments: Formation, Observation and Manipulation.- Three-Dimensional Filament Observation.- Reliability Threats in CBRAM.- Conclusions and Outlook.    

Notă biografică

Umberto Celano received a M.Sc. degree in Nanoelectronics from the University of Rome ``Sapienza'', Italy and a Ph.D. degree in Physics from the KU Leuven, Belgium in 2011 and 2015 respectively. Currently, he is a researcher in the material and component analysis group of imec in Belgium. Umberto's research interests include nanometer scale issues in materials, emerging nanoelectronics and physical characterization. His goal is to explore methods and novel metrology techniques that enable the understanding of the physics in nanomaterials and nanoelectronics devices.

Textul de pe ultima copertă

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. 

Caracteristici

Nominated as an outstanding PhD thesis by the KU Leuven and Imec, Belgium Presents a valuable new Scanning Probe Microscopy concept Represents an important step forward in 3D metrology Author awarded the Roger A. Haken Best Paper Award at the International Electron Devices Meeting (IEDM) 2013 Includes supplementary material: sn.pub/extras