Cantitate/Preț
Produs

X-ray and Neutron Techniques for Nanomaterials Characterization

Editat de Challa S. S. R. Kumar
en Limba Engleză Hardback – 24 oct 2016
Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 178856 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 29 iun 2018 178856 lei  6-8 săpt.
Hardback (1) 179486 lei  6-8 săpt.
  Springer Berlin, Heidelberg – 24 oct 2016 179486 lei  6-8 săpt.

Preț: 179486 lei

Preț vechi: 218885 lei
-18% Nou

Puncte Express: 2692

Preț estimativ în valută:
34353 35805$ 28598£

Carte tipărită la comandă

Livrare economică 04-18 ianuarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9783662486047
ISBN-10: 3662486040
Pagini: 850
Ilustrații: X, 830 p. 328 illus., 273 illus. in color.
Dimensiuni: 155 x 235 x 44 mm
Greutate: 1.34 kg
Ediția:1st ed. 2016
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany

Cuprins

Synchrotron X-ray phase nano-tomography for bone tissue characterization.- 3D chemical imaging of nanoscale biological, environmental, and synthetic materials by soft X-ray STXM spectro-tomography.- X-ray photon correlation spectroscopy for the characterization of soft and hard condensed matter.- XAFS for characterization of nanomaterials.- The characterization of atomically precise nano clusters using X-ray absorption spectroscopy.- X-ray absorption spectroscopic characterization of nanomaterial catalysts in electrochemistry and fuel cells.- In situ SXS and XAFS measurements of electrochemical interface.- Gas-phase near-edge X-ray absorption fine structure (NEXAFS) spectroscopy of nanoparticles, biopolymers, and ionic species.- In situ X-ray reciprocal space mapping for characterization of nanomaterials.- X-ray powder diffraction characterization of nanomaterials.- X-ray absorption fine structure analysis of catalytic nanomaterials.- Contribution of small angle X-ray andneutron scattering (SAXS & SANS) to the characterization of natural nano-materials.- Synchrotron small-angle X-ray scattering and small-angle neutron scattering studies of nanomaterials.- Quasi-elastic neutron scattering: An advanced technique for studying the relaxation processes in condensed matter.

Notă biografică

Dr. Challa S.S.R. Kumar is currently with Harvard University as a Managing Director. He was previously the Director of Nanofabrication and Nanomaterials at the Center for Advanced Microstructures and Devices at Louisiana State University in Baton Rouge, USA. He is also President and CEO of Magnano Technologies and has some years of industrial R&D experience working for Imperial Chemical Industries and United Breweries. His main research interests are the development of novel synthetic methods, including those based on microfluidic reactors, for the synthesis of multifunctional nanomaterials. Dr. Kumar is the winner of the 2006 Nano 50 Technology Award for his work in magnetic-based nanoparticles for cancer imaging and treatment. He is currently the Editor-in-Chief of the international journal “Nanotechnology Reviews”. He has been editor and author of several books and journal articles, and the founding editor of the Journal of Biomedical Nanotechnology.

Caracteristici

Comprehensive presentation of X-ray and Neutron Techniques for Nanomaterials Characterization Fifth volume of a 40-volume series on Nanoscience and Nanotechnology included in SpringerMaterials Highly application-oriented overview of modern topics of X-ray and Neutron Techniques for Nanomaterials Characterization