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Advances in Optics of Charged Particle Analyzers: Part 2: Advances in Imaging and Electron Physics, cartea 233

Peter W. Hawkes, Martin Hÿtch
en Limba Engleză Hardback – 28 feb 2025
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and more
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Specificații

ISBN-13: 9780443317200
ISBN-10: 0443317208
Pagini: 298
Dimensiuni: 152 x 229 mm
Greutate: 0.45 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Cuprins

Prefece
1. Electrostatic Energy Analyzers
Mikhail Yavor
2. Mass Analyzers With Combined Electrostatic and Magnetic Fields
Mikhail Yavor
3. Mass Analyzers based on Fourier Transform
Mikhail Yavor
4. Principles of Time-of-Flight Mass Analyzers
Mikhail Yavor
5. Multi-Pass Time-of-Flight Mass Analyzers
Mikhail Yavor
6. Radiofrequency Mass Analyzers
Mikhail Yavor