Advances in Optics of Charged Particle Analyzers: Part 2: Advances in Imaging and Electron Physics, cartea 233
Peter W. Hawkes, Martin Hÿtchen Limba Engleză Hardback – apr 2025
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and more
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Specificații
ISBN-13: 9780443317200
ISBN-10: 0443317208
Pagini: 232
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0443317208
Pagini: 232
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Cuprins
Prefece
1. Electrostatic Energy Analyzers
Mikhail Yavor
2. Mass Analyzers With Combined Electrostatic and Magnetic Fields
Mikhail Yavor
3. Mass Analyzers based on Fourier Transform
Mikhail Yavor
4. Principles of Time-of-Flight Mass Analyzers
Mikhail Yavor
5. Multi-Pass Time-of-Flight Mass Analyzers
Mikhail Yavor
6. Radiofrequency Mass Analyzers
Mikhail Yavor
1. Electrostatic Energy Analyzers
Mikhail Yavor
2. Mass Analyzers With Combined Electrostatic and Magnetic Fields
Mikhail Yavor
3. Mass Analyzers based on Fourier Transform
Mikhail Yavor
4. Principles of Time-of-Flight Mass Analyzers
Mikhail Yavor
5. Multi-Pass Time-of-Flight Mass Analyzers
Mikhail Yavor
6. Radiofrequency Mass Analyzers
Mikhail Yavor