Modern Map Methods in Particle Beam Physics: Advances in Imaging and Electron Physics, cartea 108
Peter W. Hawkesen Limba Engleză Hardback – 21 sep 1999
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Specificații
ISBN-13: 9780120147502
ISBN-10: 0120147505
Pagini: 318
Dimensiuni: 152 x 229 x 21 mm
Greutate: 0.62 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0120147505
Pagini: 318
Dimensiuni: 152 x 229 x 21 mm
Greutate: 0.62 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.Cuprins
Dynamics. Differential Algebraic Techniques. Fields. Maps: Calculation. Maps: Properties. Spectrometers. Repetitive Systems.
Recenzii
Praise for the Series
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE