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Modern Map Methods in Particle Beam Physics: Advances in Imaging and Electron Physics, cartea 108

Peter W. Hawkes
en Limba Engleză Hardback – 21 sep 1999
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Specificații

ISBN-13: 9780120147502
ISBN-10: 0120147505
Pagini: 318
Dimensiuni: 152 x 229 x 21 mm
Greutate: 0.62 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Public țintă

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Cuprins

Dynamics. Differential Algebraic Techniques. Fields. Maps: Calculation. Maps: Properties. Spectrometers. Repetitive Systems.

Recenzii

Praise for the Series
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE