Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 178
Peter W. Hawkesen Limba Engleză Hardback – 31 iul 2013
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
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Specificații
ISBN-13: 9780124077010
ISBN-10: 0124077013
Pagini: 280
Dimensiuni: 152 x 229 x 22 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0124077013
Pagini: 280
Dimensiuni: 152 x 229 x 22 mm
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
Generalized axiomatic scale-space theoryTony Lindeberg
Smoothlet Transform: Theory and ApplicationsAgnieszka Lisowska
Theory and Computation of Electron Mirrors: The Central Particle MethodEvgeniy M. Yakushev
Smoothlet Transform: Theory and ApplicationsAgnieszka Lisowska
Theory and Computation of Electron Mirrors: The Central Particle MethodEvgeniy M. Yakushev
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE