Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy: Advances in Imaging and Electron Physics, cartea 153
Peter W. Hawkesen Limba Engleză Hardback – 17 dec 2008
- First book on the subject of correctors
- Well known contributors from academia and microscope manufacturers
- Provides an ideal starting point for preparing funding proposals
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Specificații
ISBN-13: 9780123742209
ISBN-10: 012374220X
Pagini: 590
Dimensiuni: 152 x 229 x 33 mm
Greutate: 1.04 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 012374220X
Pagini: 590
Dimensiuni: 152 x 229 x 33 mm
Greutate: 1.04 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
All users of electron microscopes as well as physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
History of aberration correction in electron microscopy (H. Rose)Present and future hexapole aberration correctors for high resolution electron microscopy (M. Haider)Aberration correction and STEM (O.L. Krivanek)First results using the Nion third order STEM corrector (P. Batson) STEM and EELS: Mapping materials atom by atom (A.B. Bleloch) Aberration correction with the SACTEM-Toulouse: from imaging to diffraction (F. Houdellier et al.) Novel aberration corrections concepts (B. Kabius) Aberration corrected imaging in CTEM and STEM (A. Kirkland et al.)Materials applications of aberration-corrected STEM (S.J. Pennycook et al.)Spherical aberration corrected transmission electron microscopy for nanomaterials in Japan (N. Tanaka)Atomic-resolution aberration-corrected transmission electron microscopy (K. Urban et al.) Aberration-corrected electron microscopes at Brookhaven National Laboratory (Y. Zhu and J. Wall)
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE