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Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 181

Peter W. Hawkes
en Limba Engleză Hardback – 6 mar 2014
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field
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Specificații

ISBN-13: 9780128000915
ISBN-10: 0128000910
Pagini: 240
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.54 kg
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics


Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Cuprins

  1. Octree Grid Topology Preserving Geometric Deformable ModelYing Bai, Xiao Han and Jerry L. Prince
  2. Second Order Variational Models for Image Texture AnalysisMaïtine Bergounioux
  3. Electron Microscopy of Pharmaceutical SystemsVictoria Klang and Nadejda B. Matsko

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE