Advances in Imaging and Electron Physics: Advances in Imaging and Electron Physics, cartea 181
Peter W. Hawkesen Limba Engleză Hardback – 6 mar 2014
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
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Specificații
ISBN-13: 9780128000915
ISBN-10: 0128000910
Pagini: 240
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.54 kg
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0128000910
Pagini: 240
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.54 kg
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.Cuprins
- Octree Grid Topology Preserving Geometric Deformable ModelYing Bai, Xiao Han and Jerry L. Prince
- Second Order Variational Models for Image Texture AnalysisMaïtine Bergounioux
- Electron Microscopy of Pharmaceutical SystemsVictoria Klang and Nadejda B. Matsko
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE