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Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope de Peter W. Hawkes

Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope: Advances in Imaging and Electron Physics, cartea 159

Peter W. Hawkes
en Limba Engleză Hardback – 29 noi 2009
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.

  • Updated with contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Provides an invaluable reference and guide for physicists, engineers and mathematicians
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Specificații

ISBN-13: 9780123749864
ISBN-10: 0123749867
Pagini: 320
Dimensiuni: 152 x 229 x 33 mm
Greutate: 0.79 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Locul publicării:United Kingdom

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

The beginnings and development of the scanning transmission electron microscope (STEM)
Albert V. Crewe
STEM in the life sciences
Andreas Engel
The AEI and Siemens STEM instruments
Peter Hawkes
STEM in Japan
Hiromi Inada
Early work on the STEM
Michael S. Isaacson
The Toulouse high-voltage STEM project
Bernard Jouffrey
Aberration-corrected STEM
Ondrej Krivanek
STEM in Cambridge
K.C.A. Smith
A review of the cold field electron cathode
Lyn Swanson and Greg Schwind
STEM in Oxford and at Vacuum Generators
Sebastian von Harrach
The Vacuum Generators STEM
Ian Wardell and Peter Bovey
Historical background of the STEM at Brookhaven National Laboratory
Joseph Wall

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE