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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers de Peter W. Hawkes

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: Advances in Imaging and Electron Physics, cartea 162

Peter W. Hawkes
en Limba Engleză Hardback – 5 aug 2010
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații

ISBN-13: 9780123813169
ISBN-10: 0123813166
Pagini: 296
Dimensiuni: 152 x 229 x 20 mm
Greutate: 0.52 kg
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics

Public țintă

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Cuprins

1. Energy Filtered X-ray Photoemission electronmicroscopy(EXPEEM)- Kiyotaka Asakura
2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff
3. Comparison of color demosaicing methods- O. Lossona
4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe
5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis
6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Škapin

Recenzii

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE