Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles: Advances in Imaging and Electron Physics, cartea 166
Peter W. Hawkesen Limba Engleză Hardback – 28 iul 2011
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
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Specificații
ISBN-13: 9780123813107
ISBN-10: 0123813107
Pagini: 752
Dimensiuni: 152 x 229 x 50 mm
Greutate: 1.17 kg
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
ISBN-10: 0123813107
Pagini: 752
Dimensiuni: 152 x 229 x 50 mm
Greutate: 1.17 kg
Ediția:New.
Editura: ELSEVIER SCIENCE
Seria Advances in Imaging and Electron Physics
Public țintă
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in generalCuprins
- Beam equations
- Exact solutions to the beam equations
- Anti-paraxial expansions
- Solution of the beam formation problem in 3D case
- Asymptotic theory of 3D flows
- Geometrized theory
- Examples of applications
Recenzii
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE