Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations
Autor Wesley C. Sandersen Limba Engleză Hardback – 14 oct 2019
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Specificații
ISBN-13: 9780367371234
ISBN-10: 0367371235
Pagini: 153
Ilustrații: 89
Dimensiuni: 156 x 234 mm
Greutate: 0.38 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
ISBN-10: 0367371235
Pagini: 153
Ilustrații: 89
Dimensiuni: 156 x 234 mm
Greutate: 0.38 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Cuprins
1. Introduction to Atomic Force Microscopy 2. Tip-Sample Forces 3. AFM Electronics 4. AFM Cantilevers and Probes 5. Contact Mode AFM 6. Lateral Force Microscopy 7. Conductive Atomic Force Microscopy 8. Oscillating Modes of AFM 9. Image Processing
Notă biografică
Wesley C. Sanders is currently an assistant professor at Salt Lake Community College. He teaches courses in nanotechnology, materials science, chemistry, and microscopy. While serving as an assistant professor, he has published articles in the Journal of Chemical Education describing undergraduate labs for use in introductory, nanotechnology courses.
Descriere
This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.