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Characterization of Nanoparticles: Measurement Processes for Nanoparticles: Micro and Nano Technologies

Editat de Vasile-Dan Hodoroaba, Wolfgang Unger, Alexander Shard
en Limba Engleză Paperback – 23 sep 2019
Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge.
In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation.


  • Helps readers decide which nanocharacterization method is best for each measurement problem, including limitations, advantages and disadvantages
  • Shows which nanocharacterization methods are best for different classes of nanomaterial
  • Demonstrates the practical use of a method based on selected case studies
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Specificații

ISBN-13: 9780128141823
ISBN-10: 0128141824
Pagini: 566
Dimensiuni: 191 x 235 mm
Greutate: 0.96 kg
Editura: ELSEVIER SCIENCE
Seria Micro and Nano Technologies


Public țintă

Materials scientists, chemists and chemical engineers who are looking to learn more about nanocharacterization for matreials selection at the nanoparticle level

Cuprins

1. Introduction2. Characterization of Physical Properties3. Bulk and Surface Chemical Characterization of Nanoparticles4. Advantages by Combination of Methods and New Methods on the Horizon 5. Survey on Metrology and Standardization