Controlled Atmosphere Transmission Electron Microscopy: Principles and Practice
Editat de Thomas Willum Hansen, Jakob Birkedal Wagneren Limba Engleză Hardback – 26 oct 2015
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Specificații
ISBN-13: 9783319229874
ISBN-10: 3319229877
Pagini: 329
Ilustrații: VIII, 329 p. 152 illus., 110 illus. in color.
Dimensiuni: 155 x 235 x 21 mm
Greutate: 0.65 kg
Ediția:1st ed. 2016
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
ISBN-10: 3319229877
Pagini: 329
Ilustrații: VIII, 329 p. 152 illus., 110 illus. in color.
Dimensiuni: 155 x 235 x 21 mm
Greutate: 0.65 kg
Ediția:1st ed. 2016
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
Public țintă
ResearchCuprins
The history of controlled atmosphere TEM.- The instrument.- Electron scattering on matter – imaging in gas.- Spectroscopy.- Instrument performance.- Gas handling.- Heating systems.- Electron-gas-sample effects/control experiments.- ESTEM.- Growth experiments.- Closed cell systems.- Liquid experiments.- Related techniques.
Notă biografică
Thomas Hansen was born in Helsingør, Denmark andreceived his masters from the University of Copenhagen. He worked as a research scientist at Haldor Topsøe A/S, where he continued his PhD studies in collaboration with the University of New Mexico and the Technical University of Denmark. After serving as a post-doctoral fellow at the Fritz Haber Institute in Berlin, Dr. Hansen returned to Denmark as a researcher at the Center for Electron Nanoscopy at the Technical University and continues there as a senior researcher. He is responsible for the department’s aberration corrected environmental transmission electron microscope and teaches a course on the use of electron microscopy for materials research along with guest lecturing in several other courses and international workshops.
Dr. Hansen has published more than 70 peer-reviewed papers on characterization using electron microscopy and has organized several symposia at international conferences with in situ microscopy as themain theme.
Jakob B. Wagner was born in Odense, Denmark in 1974. He received his Master of Science in Physics degree at the University of Southern Denmark, Odense in 1999. In 2002, after completing his PhD studies at University of Copenhagen in collaboration with Haldor Topsøe A/S, Dr. Wagner served as a post doctoral fellow first at
the Fritz Haber Institute in Berlin, Germany, then at Lund University, Sweden. In 2007, Dr. Wagner became a senior researcher at the newly started Center for Electron Nanoscopy at the Technical University of Denmark, where he became Scientific Director and Professor in 2013. He is responsible for the overall scientific use of the electron microscopy facility along with teaching and lecturing at various courses and workshops in advanced electron microscopy. Dr. Wagner has published over 90 papers where electron microscopy has been a major tool for characterization and has organized several symposia at international conferences with insitu microscopy as the main theme
Dr. Hansen has published more than 70 peer-reviewed papers on characterization using electron microscopy and has organized several symposia at international conferences with in situ microscopy as themain theme.
Jakob B. Wagner was born in Odense, Denmark in 1974. He received his Master of Science in Physics degree at the University of Southern Denmark, Odense in 1999. In 2002, after completing his PhD studies at University of Copenhagen in collaboration with Haldor Topsøe A/S, Dr. Wagner served as a post doctoral fellow first at
the Fritz Haber Institute in Berlin, Germany, then at Lund University, Sweden. In 2007, Dr. Wagner became a senior researcher at the newly started Center for Electron Nanoscopy at the Technical University of Denmark, where he became Scientific Director and Professor in 2013. He is responsible for the overall scientific use of the electron microscopy facility along with teaching and lecturing at various courses and workshops in advanced electron microscopy. Dr. Wagner has published over 90 papers where electron microscopy has been a major tool for characterization and has organized several symposia at international conferences with insitu microscopy as the main theme
Textul de pe ultima copertă
This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered, together with common problems and pitfalls of the technique. Not only will a properly operated instrument and a carefully set up experiment provide new insight into your specimen, but the ability to observe the specimen in its natural habitat will be essential to meeting specific design criteria for the development of the next generation of materials. Over the past five decades, transmission electron microscopy (TEM) under environmental conditions relevant to a particular sample has been of increasing interest. Symposia dealing with the topic are now among the best attended at international microscopy conferences. Since typical operating modes for the ETEM require the sample be subjected to a harsh environment consisting of corrosive gases and high temperatures, the challenges of adapting and operating the instrument for observation under dynamic operating conditions are numerous. However, careful consideration of the interaction of the electrons with the gases and sample, as well as the gases with the microscope components, can lead to highly rewarding results. In Controlled Atmosphere Transmission Electron Microscopy, leading experts help you to perform successful experiments using the ETEM, and to interpret and understand the results.
Caracteristici
Provides the keys to performing a successful ETEM experiment Includes details of the instrument setup Offers expert insight into the parameters that affect instrument performance Presents practical experimental examples showing how the reader can benefit from ETEM Describes the proper analysis of an ETEM experiment Includes supplementary material: sn.pub/extras