Economics of Electronic Design, Manufacture and Test
Editat de M. Abadir, T. Ambleren Limba Engleză Hardback – 30 sep 1994
Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing.
Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product.
Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.
Toate formatele și edițiile | Preț | Express |
---|---|---|
Paperback (1) | 618.22 lei 6-8 săpt. | |
Springer Us – 7 dec 2010 | 618.22 lei 6-8 săpt. | |
Hardback (1) | 576.85 lei 39-44 zile | |
Springer Us – 30 sep 1994 | 576.85 lei 39-44 zile |
Preț: 576.85 lei
Preț vechi: 721.07 lei
-20% Nou
Puncte Express: 865
Preț estimativ în valută:
110.40€ • 116.47$ • 92.00£
110.40€ • 116.47$ • 92.00£
Carte tipărită la comandă
Livrare economică 30 decembrie 24 - 04 ianuarie 25
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9780792394716
ISBN-10: 0792394712
Pagini: 192
Ilustrații: IV, 192 p.
Dimensiuni: 210 x 279 x 16 mm
Ediția:Reprinted from JOURNAL OF ELECTRONIC TESTING: THEORY & APPLICATION, 5:2-3, 1994
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 0792394712
Pagini: 192
Ilustrații: IV, 192 p.
Dimensiuni: 210 x 279 x 16 mm
Ediția:Reprinted from JOURNAL OF ELECTRONIC TESTING: THEORY & APPLICATION, 5:2-3, 1994
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
A Tale of Two Designs: the Cheapest and the Most Economic.- Test Strategy Planning Using Economic Analysis.- Economic Modeling of Board Test Strategies.- Economics of “Design for Test” to Remain Competitive in The 90s.- The Economics of Scan-Path Design for Testability.- High Level Test Economics Advisor (Hi-TEA).- Multichip Systems Tradeoff Analysis Tool.- Trade-Off Analysis on Cost and Manufacturing Technology of an Electronic Product: Case Study.- Cost Based Surface Mount PCB Design Evaluation.- Sensitivity Analysis in Economics Based Test Strategy Planning.- Improving Quality: Yield Versus Test Coverage.- Boundary Scan in Board Manufacturing.- Comparing Quality Assurance Methods and the Resulting Design Strategies: Experiences from Complex Designs.- Trade-Offs in Scan Path and BIST Implementations for RAMs.- Techniques for Estimating Test Length Under Random Test.- Fuzzy Optimization Models for Analog Test Decisions.- Self-Test of Sequential Circuits with Deterministic Test Pattern Sequences.