Fringe 2005: The 5th International Workshop on Automatic Processing of Finge Patterns
Editat de Wolfgang Ostenen Limba Engleză Hardback – 2 sep 2005
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Specificații
ISBN-13: 9783540260370
ISBN-10: 3540260374
Pagini: 736
Ilustrații: XVIII, 714 p.
Dimensiuni: 155 x 235 x 34 mm
Greutate: 1.2 kg
Ediția:2006
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3540260374
Pagini: 736
Ilustrații: XVIII, 714 p.
Dimensiuni: 155 x 235 x 34 mm
Greutate: 1.2 kg
Ediția:2006
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Key Note.- New Methods and Tools for Data Processing.- Resolution Enhanced Technologies.- Wide Scale 4D Optical Metrology.- Hybrid Measurement Technologies.- New Optical Sensors and Measurement Systems.
Textul de pe ultima copertă
The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields.
Topics of particular interest are:
Advanced Computer Aided Measurement Techniques;
Resolution Enhanced Technologies in Optical Metrology;
New approaches in Wide Scale 4D Optical Metrology;
Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems.
Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems.
Topics of particular interest are:
Advanced Computer Aided Measurement Techniques;
Resolution Enhanced Technologies in Optical Metrology;
New approaches in Wide Scale 4D Optical Metrology;
Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems.
Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems.
Caracteristici
Includes supplementary material: sn.pub/extras