Cantitate/Preț
Produs

From Semiconductors to Proteins: Beyond the Average Structure: Fundamental Materials Research

Editat de S.J.L. Billinge, M. F. Thorpe
en Limba Engleză Hardback – 31 mar 2002
This series of books, which is published at the rate of about one per year, addresses fundamental problems in materials science. The contents cover a broad range of topics from small clusters of atoms to engineering materials and involve chemistry, physics, materials science, and engineering, with length scales ranging from Angstroms up to millimeters. The emphasis is on basic science rather than on applications. Each book focuses on a single area of current interest and brings together leading experts to give an up-to-date discussion of their work and the work of others. Each article contains enough references that the interested reader can access the relevant literature. Thanks are given to the Center for Fundamental Materials Research at Michigan State University for supporting this series. M.F. Thorpe, Series Editor E-mail: thorpe@pa.msu.edu East Lansing, Michigan, November 200 I v PREFACE The study of the atomic structure of crystalline materials began at the beginning of the twentieth century with the discovery by Max von Laue and by W.H. and W.L. Bragg that crystals diffract x-rays. At that time, even the existence of atoms was controversial.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 86835 lei  6-8 săpt.
  Springer Us – 17 sep 2012 86835 lei  6-8 săpt.
Hardback (1) 93014 lei  6-8 săpt.
  Springer Us – 31 mar 2002 93014 lei  6-8 săpt.

Din seria Fundamental Materials Research

Preț: 93014 lei

Preț vechi: 113432 lei
-18% Nou

Puncte Express: 1395

Preț estimativ în valută:
17802 18780$ 14835£

Carte tipărită la comandă

Livrare economică 03-17 ianuarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9780306472398
ISBN-10: 0306472392
Pagini: 287
Ilustrații: X, 287 p.
Dimensiuni: 178 x 254 x 27 mm
Greutate: 0.79 kg
Ediția:2002
Editura: Springer Us
Colecția Springer
Seria Fundamental Materials Research

Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

1. Techniques Taking us Beyond the Average Structure.- Analysis of Single-Crystal Diffuse X-Ray Scattering Via Automatic Refinement of a Monte Carlo Model.- Medium-Range Atomic Correlation from the PDF Analysis.- X-Ray Truncation Rod Analysis of the Reversible Temperature Dependent Surface Structure of LaAIO3.- 2. How do Semiconductors and Inorganic Materials Take the Strain?.- Local Dislocation Structure from Laue Diffraction.- Processes of Self—Organization during Epitaxial Growth of Semiconductor Superlattices — An X—Ray Scattering Study.- Total Scattering and Reverse Monte Carlo Modelling of Disordered Crystalline Materials.- Notes on the Analysis of Data for Pair Distribution Functions.- 3. Taking Charge of Disorderliness in Physics and Chemistry.- Local Structure: The Realm of the Chemist?.- From Crystals to Nanocrystals: Semiconductors and Beyond.- Structural Modeling of Nanoporous Carbon: A Review of Approaches to Simulating an Aperiodic and Non-Equilibrium Solid.- The Structure of Jahn-Teller Polarons in the Colossal Magnetoresistive Manganites.- 4. Small Molecules, Complex Fluids, and Proteins.- Energy Dispersive X-Ray Absorption Spectroscopy; A Tool for Time Resolved Structural Studies of Chemical Reactions in Solution.- Experimental Determination of the Structures of Complex Liquids: Beyond the PDF.- X-Ray Absorption Spectroscopy Studies of Non-Polar Solute Hydration Structure.- High Resolution Diffuse X-Ray Scattering by Protein Crystals — From hkl to 000.- Participants.