Image-Based Fractal Description of Microstructures
Autor J.M. Li, Li Lü, Man On Lai, B. Ralphen Limba Engleză Hardback – 31 iul 2003
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.
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Springer Us – 31 iul 2003 | 636.69 lei 6-8 săpt. |
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Specificații
ISBN-13: 9781402075070
ISBN-10: 1402075073
Pagini: 292
Ilustrații: XIII, 272 p.
Dimensiuni: 155 x 235 x 21 mm
Greutate: 0.62 kg
Ediția:2003
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1402075073
Pagini: 292
Ilustrații: XIII, 272 p.
Dimensiuni: 155 x 235 x 21 mm
Greutate: 0.62 kg
Ediția:2003
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
Professional/practitionerCuprins
1 Introduction.- 2 Digital Images of Microstructures.- 3 Image Processing.- 4 Fundamental Statistics.- 5 Fractal Fundamentals.- 6 Fractal Measurements of Projection Microstructures.- 7 Fractal Measurements of Topographical Images from 3D Surfaces.- 8 Irregularity of Graphite Nodules.- 9 Fractal Growth of Graphite Nodules.- 10 Fractal—based Study of Magnetic Thin Films.- 11 Fractal-based Study of Fracture Surfaces.- References.