In-Situ Microscopy in Materials Research: Leading International Research in Electron and Scanning Probe Microscopies
Editat de Pratibha L. Gaien Limba Engleză Hardback – 30 sep 1997
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Specificații
ISBN-13: 9780792399896
ISBN-10: 0792399897
Pagini: 336
Ilustrații: XVIII, 336 p. 183 illus.
Dimensiuni: 155 x 235 x 21 mm
Greutate: 0.68 kg
Ediția:1997
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 0792399897
Pagini: 336
Ilustrații: XVIII, 336 p. 183 illus.
Dimensiuni: 155 x 235 x 21 mm
Greutate: 0.68 kg
Ediția:1997
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
1. In-Situ Applications of Low Energy Electron Microscopy (Leem).- 1. Introduction.- 2. Phase Transitions on Clean Surfaces.- 3. Segregation.- 4. Gas-Surface Interactions.- 5. Epitaxy.- 6. Summary.- Acknowledgements and References.- 2. Environmental Scanning Electron Microscopy.- 1. Introduction.- 2. Gas Dynamics.- 3. Electron Beam Transfer.- 4. Contrast and Resolution.- 5. Detection.- 6. Cathodoluminescence.- 7. X-rays.- 8. Beam Irradiation Effects.- 9. Operation and Applications.- 10. Conclusions.- Acknowledgements and References.- 3. ESEM Development and Application In Cultural Heritage Conservation.- 1. Introduction.- 2. Applications.- 3. ESEM and SEM: Operational Differences.- 4. ESEM/EDS Development (1990–1997).- 5. Future Work.- Acknowledgements and References.- 4. Intrinsic Point Defect Clustering In Si: A Study by HVEM and HREM In-Situ Electron Irradiation.- 1. Introduction.- 2. Experimental Details.- 3. Results and Discussion.- 4. Conclusion.- Acknowledgements and References.- 5. In-Situ Observation and Quantitative Analysis of Electromigration Void Dynamics.- 1. Introduction.- 2. Sample Fabrication and In-Situ Test Technique.- 3. Single Void Behavior.- 4. Void-Void Interactions.- 5. Void-Hillock Interactions.- 6. Summary and Conclusions.- Acknowledgements and References.- 6. Environmental High Resolution Electron Microscopy (EHREM) In Materials Science.- 1. Introduction.- 2. Experimental: In-Situ Controlled Environmental High Resolution Transmission EM (EHREM) Development for Gas-Solid Reactions on the Atomic Scale.- 3. Applications.- 4. Conclusions.- Acknowledgements and References.- 7. In-Situ Transmission Electron Microscopy of Thin Film Growth.- 1. Introduction.- 2. Role of TEM in Studies of Thin Film Growth.- 3. Instrumental Approaches.- 4. SomeResults.- 5. Conclusions.- Acknowledgements and References.- 8. HREM In-Situ Experiment at Very High Temperatures.- 1. Introduction.- 2. Specimen-Heating Holders.- 3. Electron Microscope.- 4. HREM Observation of Si Particle just below the Melting Point.- 5. Formation of SiC through Solid State Chemical Reactions.- between Si and Graphite.- 6. Sintering of SiC Crystals.- 7. Surface Reconstruction of Au-deposited Si.- 9. In-Situ REM and TEM Studies of Homo and Hetero-Epitaxy on Si Surfaces.- 1. Introduction.- 2. Experimental.- 3. Results and Discussion.- 4. Conclusions.- References.- 10. Atomic-Scale Fabrication of Metal Surfaces by Adsorption and Chemical Reaction.- 1. Introduction.- 2. Fabrication of Metal Surfaces by Physical Processes.- 3. Fabrication of Metal Surfaces by Chemical Reaction.- 4. Nano-meter Scale Patterning by Chemical Reactions.- References.- 11. High Temperature Dynamic Behavior of Silicon Surfaces Studied by Scanning Tunneling Microscopy (STM).- 1. Introduction.- 2. High Temperature UHV-STM System.- 3. Hydrogen Desorption Process on Si (111) Surface.- 4. (7×7) - (1×1) Phase Transition on Si (111) Surface.- 5. Step Shifting under dc Electric Fields.- 6. Conclusions.- Acknowledgements and References.- 12. Dynamic Observation of Vortices in Superconductors Using Electron Waves.- 1. Introduction.- 2. Experimental Method.- 3. Observation of Superconducting Vortices.- 4. Conclusion.- References.- 13. TEM Studies of Some Structurally Flexible Solids and Their Associated Phase Transformations.- 1. Introduction.- 2. Tetrahedrally Corner-Connected Framework Structures.- 3. Tetragonal ?-PbO.- 4. Compositionally Flexible Anion-Deficient Fluorites.- and the “Defect Fluorite” to C-type Sesquioxide Transition.- 5. Summary and Conclusions.- Acknowledgementsand References.- Author Index.
Notă biografică
Pratibha L. Gai is a senior research associate at the Central Research and Development, Science and Engineering Laboratories, DuPont and an adj. professor at the University of Delaware, USA. After graduating with a PhD in physics from the University of Cambridge, England, she taught and conducted research, leading the surface reactions group at the University of Oxford, England. She was elected a fellow of Wolfson College, Oxford. Her research interests are theories and experimental aspects of electron diffraction, defects in solids, ceramics, superconductors, semiconductors, heterogeneous catalysis and chemical synthesis. She has published about 22 research papers and reviews and has given numerous invited lectures internationally. She has received several educational awards and joint grants for her key fundamental work on in-situ electron microscopy of heterogeneous catalysts, including by the Royal Society, UK and the American Chemical Society. She is a member and fellow of several professional scientific societies, Chartered Engineer of the Institute of Materials, UK and is on the editorial board of international scientific journals.