Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000: Institute of Physics Conference Series
Editat de D. Williams, R Shimizuen Limba Engleză Hardback – 2000
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Specificații
ISBN-13: 9780750306850
ISBN-10: 0750306858
Pagini: 284
Dimensiuni: 156 x 234 x 33 mm
Greutate: 1.02 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Seria Institute of Physics Conference Series
ISBN-10: 0750306858
Pagini: 284
Dimensiuni: 156 x 234 x 33 mm
Greutate: 1.02 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Seria Institute of Physics Conference Series
Public țintă
ProfessionalCuprins
Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.
Descriere
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.