MOSFET Modeling & BSIM3 User’s Guide
Autor Yuhua Cheng, Chenming Huen Limba Engleză Paperback – 28 mar 2013
In the next few years, many fabless and integrated semiconductor companies are expected to switch from dozens of other MOSFET models to BSIM3. This will require many device engineers and most circuit designers to learn the basics of BSIM3.
MOSFET Modeling & BSIM3 User's Guide explains the detailed physical effects that are important in modeling MOSFETs, and presents the derivations of compact model expressions so that users can understand the physical meaning of the model equations and parameters.
It is the first book devoted to BSIM3. It treats the BSIM3 model in detail as used in digital, analog and RF circuit design. It covers the complete set of models, i.e., I-V model, capacitance model, noise model, parasitics model, substrate current model, temperature effect model and non quasi-static model.
MOSFET Modeling & BSIM3 User's Guide not only addresses the device modeling issues but also provides a user's guide to the device or circuit design engineers who use the BSIM3 model in digital/analog circuit design, RF modeling, statistical modeling, and technology prediction.
This book is written for circuit designers and device engineers, as well as device scientists worldwide. It is also suitable as a reference for graduate courses and courses in circuit design or device modelling. Furthermore, it can be used as a textbook for industry courses devoted to BSIM3.
MOSFET Modeling & BSIM3 User's Guide is comprehensive and practical. It is balanced between the background information and advanced discussion of BSIM3. Itis helpful to experts and students alike.
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Specificații
ISBN-13: 9781475784428
ISBN-10: 1475784422
Pagini: 480
Ilustrații: XVI, 462 p.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.67 kg
Ediția:2002
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1475784422
Pagini: 480
Ilustrații: XVI, 462 p.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.67 kg
Ediția:2002
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Significant Physical Effects In Modern MOSFETs.- Threshold Voltage Model.- I–V Model.- Capacitance Model.- Substrate Current Model.- Noise Model.- Source/Drain Parasitics Model.- Temperature Dependence Model.- Non-quasi Static (NQS) Model.- BSIM3v3 Model Implementation.- Model Testing.- Model Parameter Extraction.- RF and Other Compact Model Applications.