Nanotribology and Nanomechanics: An Introduction
Editat de Bharat Bhushanen Limba Engleză Hardback – 11 apr 2017
This 4th edition has been completely revised and updated, concentrating on the key measurement techniques, their applications, and theoretical modeling of interfaces. It provides condensed knowledge of the field from the mechanics and materials science perspectives to graduate students, research workers, and practicing engineers.
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Specificații
ISBN-13: 9783319514321
ISBN-10: 3319514326
Pagini: 1172
Ilustrații: XVI, 928 p. 656 illus., 156 illus. in color.
Dimensiuni: 178 x 254 x 49 mm
Greutate: 1.94 kg
Ediția:4th ed. 2017
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
ISBN-10: 3319514326
Pagini: 1172
Ilustrații: XVI, 928 p. 656 illus., 156 illus. in color.
Dimensiuni: 178 x 254 x 49 mm
Greutate: 1.94 kg
Ediția:4th ed. 2017
Editura: Springer International Publishing
Colecția Springer
Locul publicării:Cham, Switzerland
Cuprins
Introduction - Measurement Techniques and Applications.- Part I. Scanning Probe Microscopy: Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes.- Calibration of Normal and Lateral Forces in Cantilevers used in Atomic Force Microscopy.- Biomedical Sensing with the Atomic Force Microscope.- Part II. Nanomechanics: Nanomechanical Properties of Solid Surfaces and Thin Films.- Nanomechanical Properties of Nanostructures and Scale Effects.- Computer Simulations of Nanometer-Scale Indentation and Friction.- Part III. Nanotribology: Nanotribology, Nanomechanics, and Materials Characterization Studies Using Scanning Probe Microscopy.- Surface Forces and Nanorheology of Molecularly Thin Films.- Atomic Scale Friction Phenomena.- Scale Effect in Mechanical Properties and Tribology.- Part IV. Molecularly-Thick Films for Lubrication: Nanotribology of Ultrathin and Hard Amorphous Carbon Films.- Self-Assembled Monolayers for Controlling Adhesion, Friction, and Wear.-Nanoscale Boundary Lubrication Studies.- Part V. Industrial Applications: Micro/Nanotribology and Micro/Nanomechanics of Magnetic Storage Devices.- Nanotribology and Nanomechanics of MEMS/NEMS and BioMEMS/NEMS Materials and Devices.
Notă biografică
Dr. Bharat Bhushan is an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, a Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics (NLBB) at the Ohio State University, Columbus, Ohio. He holds two M.Sc., a Ph.D. in mechanical engineering/mechanics, an MBA, and four semi-honorary and honorary doctorates. His research interests are in Fundamental studies in the interdisciplinary areas of bio/nanotribology/nanomechanics and nanomaterials characterization in bio/nanotechnology and biomimetics with a focus on scanning probe techniques.
Textul de pe ultima copertă
This textbook and comprehensive reference source and serves as a timely, practical introduction to the principles of nanotribology and nanomechanics.
This 4th edition has been completely revised and updated, concentrating on the key measurement techniques, their applications, and theoretical modeling of interfaces. It provides condensed knowledge of the field from the mechanics and materials science perspectives to graduate students, research workers, and practicing engineers.
This 4th edition has been completely revised and updated, concentrating on the key measurement techniques, their applications, and theoretical modeling of interfaces. It provides condensed knowledge of the field from the mechanics and materials science perspectives to graduate students, research workers, and practicing engineers.
Caracteristici
Presents a comprehensive reference and textbook to the principles of nanotribology and nanomechanics Offers a timely introduction to the main topics of nanomechanics for teaching and self-study purposes Integrates knowledge of the field from the mechanics and materialsscience perspectives Covers key measurement techniques, their applications, and theoretical modelling of interfaces Includes supplementary material: sn.pub/extras