New Developments in Semiconductor Physics: Proceedings of the Third Summer School, Held at Szeged, Hungary, August 31 – September 4, 1987: Lecture Notes in Physics, cartea 301
Editat de George Ferenczi, F. Beleznayen Limba Engleză Paperback – 23 aug 2014
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Specificații
ISBN-13: 9783662136690
ISBN-10: 3662136694
Pagini: 312
Ilustrații: VI, 302 p. 109 illus.
Dimensiuni: 170 x 244 x 16 mm
Greutate: 0.5 kg
Ediția:Softcover reprint of the original 1st ed. 1988
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Lecture Notes in Physics
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3662136694
Pagini: 312
Ilustrații: VI, 302 p. 109 illus.
Dimensiuni: 170 x 244 x 16 mm
Greutate: 0.5 kg
Ediția:Softcover reprint of the original 1st ed. 1988
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Lecture Notes in Physics
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Integer quantum hall effect.- Theory of the energy loss rate of hot electrons in 2D systems.- The transport problem.- Cyclotron resonance of quasi-two-dimensional polarons.- On the concentration dependence of the thermal activation energy of impurities in semicondectors.- The use of hydrostatic pressure and alloying to introduce deep levels in the forbidden gap of InSb and GaAS.- Electronic structure of complex defects in silicon.- Electron microscopy in semiconductor physics.- Determination of the lateral defect distribution by SDLTS in GaAs.- Formation of ribbon-like defects during low-temperature annealing of Czochralski-grown silicon.- Band-edge offsets in semiconductor heterojunctions.- Defect dynamics in crystalline and amorphous silicon.- On the diffusion of oxygen in a silicon crystal.- Hexagonal site interstitial related states in silicon.- The diffusion and electronic structure of hydrogen in silicon.- Spectroscopic studies of point defects in silicon and germanium.- Deep levels in Cz-Si due to heat treatment at 600...900 °C.- Interpretation of the electric field dependent thermal emission data of deep traps.- Electrochemical characterization of GaAs and its multilayer structure materials.- Positron study of defects in GaAs.- Deep level profiling technique in the semiconductor of MIS structure.- Transition metal impurities in silicon.- Electronic properties of pairs of shallow acceptors with iron or manganese in silicon.- MOCVD technology.- Epitaxial growth of PBTE doping superlattices on (111) BaF2 and (100) GaAs.- Energy distribution of interface states in GaAs-Cr/Au Schottky contacts obtained from I–V characteristics.- Surface work function transients of tunnel SIO2-SI structures.