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Particle Induced Electron Emission I: Springer Tracts in Modern Physics, cartea 122

Contribuţii de Max Rösler, Wolfram Brauer, Jacques Devooght, Jean-Claude Dehaes, Alain Dubus, Michel Cailler, Jean-Pierre Ganachaud
en Limba Engleză Paperback – 3 oct 2013
This monograph discusses collision-induced electron emission from nearly free-electron metals by ion or electron impact. This subject is, as is well known, of acute importance in understanding plasma-wall interactions in thermonuclear reactors. It is also the basis for one of the most exciting technological developments of the last few years - scanning electron miscroscopy. Several electron excitation mechanisms of electrons in the target are considered: excitation of single conduction and core electrons, excitation by plasmon decay and by Auger processes. Transport of inner excited electrons is simulated by the Boltzmann equation incorporating both elastic and inelastic collisions. The numerical calculation of scattering rates uses a dynamically screened Coulomb interaction. These results for the energy distributions of emerging electrons as well as the electron yield are compared with recent experimental measurements on electron emission from polycrystalline aluminum.
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Specificații

ISBN-13: 9783662149997
ISBN-10: 3662149990
Pagini: 148
Ilustrații: IX, 137 p. 5 illus. in color.
Dimensiuni: 155 x 235 x 8 mm
Greutate: 0.22 kg
Ediția:Softcover reprint of the original 1st ed. 1991
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Tracts in Modern Physics

Locul publicării:Berlin, Heidelberg, Germany

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Cuprins

Theory of electron emission from nearly-free-electron metals by proton and electron bombardment.- Theoretical description of secondary electron emission induced by electron or ion beams impinging on solids.