Machine Learning Support for Fault Diagnosis of System-on-Chip Editat de Patrick Girard et al. 14 mar 2024 Paperback Preț: 427.64 lei 38-44 zile
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Autor Alberto Bosio et al. 4 noi 2009 Hardback Preț: 641.20 lei 754.36 lei 6-8 săpt. -15%
Power-Aware Testing and Test Strategies for Low Power Devices Editat de Patrick Girard et al. 5 sep 2014 Paperback Preț: 701.25 lei 825.01 lei 6-8 săpt. -15%
Dynamic Formal Epistemology Synthese Library, nr. 351 Editat de Patrick Girard et al. 25 feb 2013 Paperback Preț: 638.24 lei 750.88 lei 6-8 săpt. -15%