Philosophy of Technology – The Technological ion: An Anthology, Second Edition: Blackwell Philosophy Anthologies
Autor R Scharffen Limba Engleză Paperback – 30 ian 2014
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Specificații
ISBN-13: 9781118547250
ISBN-10: 111854725X
Pagini: 736
Dimensiuni: 189 x 246 x 39 mm
Greutate: 1.23 kg
Ediția:2nd Edition
Editura: Wiley
Seria Blackwell Philosophy Anthologies
Locul publicării:Hoboken, United States
ISBN-10: 111854725X
Pagini: 736
Dimensiuni: 189 x 246 x 39 mm
Greutate: 1.23 kg
Ediția:2nd Edition
Editura: Wiley
Seria Blackwell Philosophy Anthologies
Locul publicării:Hoboken, United States
Public țintă
All levels of students of philosophy, social and political science, cultural studies, and subjects related to technology and science, including engineering and information technology; Background reading for students in technology–related coursesNotă biografică
Robert C. Scharff is Professor of Philosophy at the University of New Hampshire. He is the author of Comte After Positivism (1995; 2002) and the former editor of Continental Philosophy Review (1995-2005). He publishes on 19th- and 20th-century Continental philosophy (especially Dilthey, Heidegger, and the hermeneutics of science), the history of positivism (especially Comte and Mill, and the connection between classical positivism and recent analytic philosophy), and the philosophy of technology. He is currently finishing a book manuscript, "How History Matters to Philosophy" and a collection of essays on Heidegger and technology, and editing a Blackwell Guidebook Series volume on Heidegger's Being and Time. Val Dusek is Professor of Philosophy at the University of New Hampshire. His research focuses on the history and philosophy of science and technology, with a particular interest in the social factors influencing scientific and technological development. He has written on non-mainstream philosophical influences (Asiatic, hermetic, romantic) on the history of electro-magnetic theory. His numerous publications include Philosophy of Technology: An Introduction (Wiley-Blackwell, 2006) and co-editorship of the first edition of this volume.