Practical Materials Characterization
Editat de Mauro Sardelaen Limba Engleză Hardback – 11 iul 2014
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Specificații
ISBN-13: 9781461492801
ISBN-10: 1461492807
Pagini: 300
Ilustrații: VII, 237 p. 118 illus., 92 illus. in color.
Dimensiuni: 155 x 235 x 20 mm
Greutate: 0.53 kg
Ediția:2014
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1461492807
Pagini: 300
Ilustrații: VII, 237 p. 118 illus., 92 illus. in color.
Dimensiuni: 155 x 235 x 20 mm
Greutate: 0.53 kg
Ediția:2014
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States
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Public țintă
Professional/practitionerCuprins
1. X-Ray Diffraction and Reflectivity.- 2. Introduction to Optical Characterization of Materials.- 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES).- 4. Secondary Ion Mass Spectrometry.- 5. Transmission Electron Microscopy.
Notă biografică
Mauro Sardela (editor) is a Senior Research Scientist and Manager of the X-Ray Analysis Laboratory at the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Dr. Sardela received his PhD in Material Science, in 1994, from the Institute of Physics of Materials, Linköping University, Sweden. He has authored and co-authored several publications in the area of x-ray scattering, materials analysis in general, with focus on semiconductors, complex oxides, nanomaterials, etc.
Judith E. Baker was a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory, University of Illinois. She began working with SIMS in the early 1970's and continued until she retired in 2003. Her collaborative efforts with researchers at the University of Illinois, other universities, and National Laboratories resulted in co-authorship of over 90 reviewed journal publications. Most of the publications include SIMS applications and involve a wide variety of materials.
Richard T. Haasch is a Senior Research Scientist and leader of the electron spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in analytical chemistry from the University of Minnesota in 1990. He has authored or co-authored over 90 publications and presentations in the area of surface analysis, materials characterization, and materials chemistry.
Julio A.N.T. Soares is a Senior Research Scientist and manager of the Laser and Spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in Solid State Physics from the University of Sao Paulo, Brazil, in 1997. He has authored or co-authored several publications and presentations in the area of opticalcharacterization of materials.
Jianguo Wen is a Materials Scientist at Electron Microscopy Center, Argonne National Laboratory. He received his Ph.D. in condensed matter physics from Institute of Physics, Chinese Academy of Sciences in 1991. He is author or co-author of over 200 publications in peer-reviewed journals in the area of transmission electron microscopy, complex oxides, nanomaterials, Li-ion batteries, superconductors, and semiconductors. With total number of citations over 6500, 15 papers were cited over 100 times.
Judith E. Baker was a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory, University of Illinois. She began working with SIMS in the early 1970's and continued until she retired in 2003. Her collaborative efforts with researchers at the University of Illinois, other universities, and National Laboratories resulted in co-authorship of over 90 reviewed journal publications. Most of the publications include SIMS applications and involve a wide variety of materials.
Richard T. Haasch is a Senior Research Scientist and leader of the electron spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in analytical chemistry from the University of Minnesota in 1990. He has authored or co-authored over 90 publications and presentations in the area of surface analysis, materials characterization, and materials chemistry.
Julio A.N.T. Soares is a Senior Research Scientist and manager of the Laser and Spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in Solid State Physics from the University of Sao Paulo, Brazil, in 1997. He has authored or co-authored several publications and presentations in the area of opticalcharacterization of materials.
Jianguo Wen is a Materials Scientist at Electron Microscopy Center, Argonne National Laboratory. He received his Ph.D. in condensed matter physics from Institute of Physics, Chinese Academy of Sciences in 1991. He is author or co-author of over 200 publications in peer-reviewed journals in the area of transmission electron microscopy, complex oxides, nanomaterials, Li-ion batteries, superconductors, and semiconductors. With total number of citations over 6500, 15 papers were cited over 100 times.
Textul de pe ultima copertă
This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.
This book also:
· Presents cross-comparison between materials characterization techniques, including x-ray diffraction and reflectivity, x-ray photoelectron spectroscopy, secondary ion mass spectrometery, ellipsometry, Raman spectroscopy, and more
· Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem
· Focuses on applications and clear data interpretation without extensive mathematics
This book also:
· Presents cross-comparison between materials characterization techniques, including x-ray diffraction and reflectivity, x-ray photoelectron spectroscopy, secondary ion mass spectrometery, ellipsometry, Raman spectroscopy, and more
· Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem
· Focuses on applications and clear data interpretation without extensive mathematics
Caracteristici
Presents cross-comparison between materials characterization techniques Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem Focuses on applications and clear data interpretation without extensive mathematics Includes supplementary material: sn.pub/extras