Probabilistic Techniques in Exposure Assessment: A Handbook for Dealing with Variability and Uncertainty in Models and Inputs
Autor Alison C. Cullen, H. Christopher Freyen Limba Engleză Paperback – 30 iul 1999
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Specificații
ISBN-13: 9780306459573
ISBN-10: 0306459574
Pagini: 336
Ilustrații: XVI, 336 p.
Dimensiuni: 155 x 235 x 18 mm
Greutate: 0.52 kg
Ediția:1999
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 0306459574
Pagini: 336
Ilustrații: XVI, 336 p.
Dimensiuni: 155 x 235 x 18 mm
Greutate: 0.52 kg
Ediția:1999
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Introduction. A Basic Framework for Probabilistic Analysis. Approaches to Model Uncertainty. Characterizing Variability and Uncertainty in Model Inputs. Data and Distributions. Special Topics Related to Distribution Development. Probabilistic Modeling Techniques. Identifying Key Contributors to Variability and Uncertainty in Model Outputs. An Illustrative Case Study of the Application of Probabilistic Exposure Assessment. Glossary. Index.
Recenzii
`...the various topics are presented extremely well from the pedagogic point of view. For readers of this journal, the most appealing feature of the book is its extensive coverage of systems modeling and simulation . Other good features of the book include: careful examination of assumptions under which probabilistic modeling is a useful and justified; excellent discussion of the many aspects of uncertainty and variability; unusually good and extensive (80-page long) coverage of probability distributions; interesting and well-described examples and the case studies in the area of risk analysis; and a useful glossary of technical terms. In summary, this is an excellent book for anyone interested in probabilistic modeling. In my opinion, it is the right book in this domain for readers of this journal and I highly recommend it.'
International Journal of General Systems, 31(1):97-110, (2002)
International Journal of General Systems, 31(1):97-110, (2002)