Quartz: Deposits, Mineralogy and Analytics: Springer Geology
Editat de Jens Götze, Robert Möckelen Limba Engleză Paperback – 9 mai 2014
The chapters are presented by leading scientists in the quartz field. The presentations cover the main interrelations between genesis of quartz - formation of specific properties - analytics - industrial applications of SiO2 raw materials.
Toate formatele și edițiile | Preț | Express |
---|---|---|
Paperback (1) | 948.29 lei 6-8 săpt. | |
Springer Berlin, Heidelberg – 9 mai 2014 | 948.29 lei 6-8 săpt. | |
Hardback (1) | 952.89 lei 6-8 săpt. | |
Springer Berlin, Heidelberg – 23 apr 2012 | 952.89 lei 6-8 săpt. |
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Specificații
ISBN-13: 9783642439216
ISBN-10: 3642439217
Pagini: 376
Ilustrații: XVI, 360 p.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.53 kg
Ediția:2012
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Geology
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642439217
Pagini: 376
Ilustrații: XVI, 360 p.
Dimensiuni: 155 x 235 x 25 mm
Greutate: 0.53 kg
Ediția:2012
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Geology
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Classification, mineralogy and industrial potential of SiO2 minerals and rocks.- Assessment of High Purity Quartz Resources.- Quality requirements of quartz sand in the building industry.-Petrological and chemical characterisation of high-purity quartz deposits with examples from Norway.- Evaluation of the potential of the pegmatitic quartz veins of the Sierra de Comechigones (Argentina) as a source of high purity quartz by a combination of LA-ICP-MS, ICP, cathodoluminescence, gas chromatography, fluid inclusion analysis, Raman and FTIR spectroscopy.- Brazilian quartz deposits and a perspective about industrial use, gemstone and color treatment.- First-principles calculations of the E'1 center in quartz: Structural models, 29Si hyperfine parameters and association with Al impurity.- Gamma-Irradiation Dependency of EPR and TL-Spectra of Quartz.- Analysis of low element concentrations in quartz by electron microprobe.-In situ analysis of trace elements in quartz using laser ablation inductively coupled plasma mass spectrometry.- Cathodoluminescence microanalysis of the defect microstructures of bulk and nanoscale ultrapure SiO2 polymorphs for device applications.- Trace element characteristics, luminescence properties and real structure of quartz.- Mineralogy, geochemistry and cathodoluminescence of authigenic quartz from different sedimentary rocks.- CL textures and trace elements in hydrothermal quartz.- Quartz regeneration and the use of quartz as a carrier of genetic information.
Textul de pe ultima copertă
The book will include contributions of the state of the art of quartz raw materials (deposits and properties) and their analytics.
The chapters are presented by leading scientists in the quartz field. The presentations cover the main interrelations between genesis of quartz - formation of specific properties - analytics - industrial applications of SiO2 raw materials.
The chapters are presented by leading scientists in the quartz field. The presentations cover the main interrelations between genesis of quartz - formation of specific properties - analytics - industrial applications of SiO2 raw materials.
Caracteristici
First state of the art compilation about quartz and quartz raw materials Covers the whole field from quartz deposits via mineralogical properties to industrial application of SiO2 Presentation of sophisticated analytical methods of quartz and SiO2 analysis Includes supplementary material: sn.pub/extras