Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979
Editat de A. Benninghoven et al.
13 dec 2011
Paperback
Preț: 622.52 lei 732.39 lei
6-8 săpt.
-15%
