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Recent Advances in Reliability Theory: Methodology, Practice and Inference: Statistics for Industry and Technology

Editat de N. Limnios, M. Nikulin
en Limba Engleză Hardback – 31 mai 2000
This book presents thirty-one extensive and carefully edited chapters providing an up-to-date survey of new models and methods for reliability analysis and applications in science, engineering, and technology. The chapters contain broad coverage of the latest developments and innovative techniques in a wide range of theoretical and numerical issues in the field of statistical and probabilistic methods in reliability.
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Specificații

ISBN-13: 9780817641351
ISBN-10: 0817641351
Pagini: 514
Dimensiuni: 186 x 260 x 31 mm
Greutate: 1.1 kg
Ediția:New.
Editura: Birkhauser
Seria Statistics for Industry and Technology

Locul publicării:Boston, MA, United States

Public țintă

Professional/practitioner

Cuprins

General Approach; Reliability: Past, Present and Future; Reliability Analysis as a Tool for Expressing and Communicating Uncertainty; II Probability Models and Related Issues; Modeling a Process of Non-Ideal Repair; Some Models and Mathematical Results for Reliability of Systems of Components; Algorithms of Stochastic Activity and Problems of Reliability; Some Shifted Stochastic Orders; Characterization of Distributions in Reliability; III Asymptotic Analysis; Asymptotic Analysis of Reliability for Switching Systems in Light and Heavy Traffic Conditions; Nonlinearly Perturbed Markov Chains and Large Deviations for Lifetime Functionals; Evolutionary Systems in an Asymptotic Split Phase Space; On Asymptotic Approach to Multistate Systems Reliability Evaluation; IV Statistical Models and Data Analysis; Computer Intensive Methods Based on Resampling in Analysis of Reliability and Survival Data; Statistical Analysis of Damage Processes; Data Analysis Based on Warranty Database; Failure Models Indexed by Time and Usage; A new multiple Proof Loads Approach for Estimating Correlations; Conditional and Partial Correlation for Graphical Uncertainty Models; V Common Methods to Reliability and