Reliability, Availability and Serviceability of Networks-on-Chip
Autor Érika Cota, Alexandre de Morais Amory, Marcelo Soares Lubaszewskien Limba Engleză Paperback – 25 noi 2014
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Specificații
ISBN-13: 9781489973504
ISBN-10: 1489973508
Pagini: 224
Ilustrații: XIII, 209 p.
Dimensiuni: 155 x 235 x 12 mm
Greutate: 0.32 kg
Ediția:2012
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1489973508
Pagini: 224
Ilustrații: XIII, 209 p.
Dimensiuni: 155 x 235 x 12 mm
Greutate: 0.32 kg
Ediția:2012
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Introduction.- NoC Basics.- Systems-on-Chip Testing.- NoC Reuse for SoC Modular Testing.- Advanced Approaches for NoC Reuse.- Test and Diagnosis of Routers.- Test and Diagnosis of Communication Channels.- Error Control Coding and Retransmission.- Error Location and Reconfiguration.- Concluding Remarks.
Textul de pe ultima copertă
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
This book first presents the characteristics of the NoC design (topologies, structures, routers, wrappers, and protocols), as well as a summary of the terms used in the field and an overview of the existing industrial and academic NoCs. Secondly, the main aspects of the test of a NoC-based system are discussed, starting with the test of the embedded cores where the NoC plays an important role. Current test strategies are presented, such as the reuse of the network for core testing, test scheduling for the NoC reuse, test access methods and interface, efficient reuse of the network, and power-aware and thermal aware NoC-based SoC testing. Then, the challenges and solutions for the NoC infrastructure (interconnects, routers, and network interface) test and diagnosis are presented. Finally, fault tolerance techniques for the NoC are discussed, including techniques based on error control coding, retransmission, fault location, and system reconfiguration.
This book first presents the characteristics of the NoC design (topologies, structures, routers, wrappers, and protocols), as well as a summary of the terms used in the field and an overview of the existing industrial and academic NoCs. Secondly, the main aspects of the test of a NoC-based system are discussed, starting with the test of the embedded cores where the NoC plays an important role. Current test strategies are presented, such as the reuse of the network for core testing, test scheduling for the NoC reuse, test access methods and interface, efficient reuse of the network, and power-aware and thermal aware NoC-based SoC testing. Then, the challenges and solutions for the NoC infrastructure (interconnects, routers, and network interface) test and diagnosis are presented. Finally, fault tolerance techniques for the NoC are discussed, including techniques based on error control coding, retransmission, fault location, and system reconfiguration.
- Provides state-of-the-art research on the challenges to test, diagnose and tolerate faults in NoC-based systems;
- Includes numerous, current test strategies, including re-use of the network for core testing, test scheduling for the NoC reuse, test access methods and interface, efficient re-use of the network, and power-aware and thermal-aware NoC-based SoC testing;
- Offers a single source reference to the latest research, otherwise available only in disparate journals and conference proceedings.
Caracteristici
Provides state-of-the-art research on the challenges to test, diagnose and tolerate faults in NoC-based systems Includes numerous, current test strategies, including re-use of the network for core testing, test scheduling for the NoC reuse, test access methods and interface, efficient re-use of the network, and power-aware and thermal-aware NoC-based SoC testing Offers a single source reference to the latest research, otherwise available only in disparate journals and conference proceedings Includes supplementary material: sn.pub/extras