Reliability of High-Power Mechatronic Systems 2: Aerospace and Automotive Applications: Issues,Testing and Analysis
Editat de Abdelkhalak El Hami, David Delaux, Henri Grzeskowiaken Limba Engleză Hardback – 8 oct 2017
- Presents a methodological guide that demonstrates the reliability of fractured mechatronic components and devices
- Includes numerical and statistical models to optimize the reliability of the product architecture
- Develops a methodology to characterize critical elements at the earliest stage in their development
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Specificații
ISBN-13: 9781785482618
ISBN-10: 1785482610
Pagini: 302
Dimensiuni: 152 x 229 x 21 mm
Editura: ELSEVIER SCIENCE
ISBN-10: 1785482610
Pagini: 302
Dimensiuni: 152 x 229 x 21 mm
Editura: ELSEVIER SCIENCE
Public țintă
Mainly all students, teacher-researchers and researchers in mechanics and particularly coupled systems. And also all academic researchers and research students, interested in the modeling and simulation of dynamic systemsCuprins
1. Accelerated Life Testing, Laurent Denis, Henri Grzeskowiak Daniel Trias and David Delaux 2. Highly Accelerated Testing Henri Grzeskowiak, Tony Lhommeau and David Delaux 3. Reliability Study for Cuboid Aluminum Capacitors with Liquid Electrolyte Chadia Lachkar, Moncef Kadi, Jean-Paterne Kouadio, Jean-François Goupy, Philippe Eudeline, Sébastien Boileau and Tarik Ait-Younes 4. The Reliability of Components: A New Generation of Film Capacitors Henri Grzeskowiak, Daniel Trias and David Delaux 5. Reliability and Qualification Tests for High-Power MOSFET Transistors Niemat Moultif, Mohamed Masmoudi, Eric Joubert and Olivier Latry 6. Fault Diagnosis in a DC/DC Converter for Electric Vehicles Houcine Chafouk and Rihab El Houda Thabet 7. Methodology and Physicochemical Characterization Techniques Used for Failure Analysis in Laboratories Morgane Presle, Daniel Trias and Sébastien Boileau 8. Reliability Study of High-Power Mechatronic Components by Spectral Photoemission Microscopy Niemat Moultif, Alexis Divay, Eric Joubert and Olivier Latry.