Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Editat de Sergei V. Kalinin, Alexei Gruvermanen Limba Engleză Hardback – 9 dec 2010
Toate formatele și edițiile | Preț | Express |
---|---|---|
Paperback (1) | 1204.95 lei 6-8 săpt. | |
Springer – 22 aug 2016 | 1204.95 lei 6-8 săpt. | |
Hardback (1) | 1215.31 lei 6-8 săpt. | |
Springer – 9 dec 2010 | 1215.31 lei 6-8 săpt. |
Preț: 1215.31 lei
Preț vechi: 1482.09 lei
-18% Nou
Puncte Express: 1823
Preț estimativ în valută:
232.59€ • 241.60$ • 193.20£
232.59€ • 241.60$ • 193.20£
Carte tipărită la comandă
Livrare economică 03-17 februarie 25
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9781441965677
ISBN-10: 144196567X
Pagini: 550
Ilustrații: XVIII, 555 p.
Dimensiuni: 155 x 235 x 32 mm
Greutate: 1.1 kg
Ediția:2011
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 144196567X
Pagini: 550
Ilustrații: XVIII, 555 p.
Dimensiuni: 155 x 235 x 32 mm
Greutate: 1.1 kg
Ediția:2011
Editura: Springer
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
I. Emergent phenomena in strongly-correlated systems: H. Weitering (UTK) – Phase separation and novel quaziparticles in nanowires.- E.W. Plummer (UT/ORNL) – STM of ruthenates and manganites.- S. Davies (Cornell)/A. Yazdani (Princeton) – STM of superconductors.- C. Renner (Imperial college) – STM of cuprates.- II. Semiconductor and photovoltaic materials: Sidney Cohen (Weitzmann) – SPM of solar materials.- R. Goldman (U. Michigan)– Cross-sectional STM of semiconductor heterostructures.- David Ginger (U. Wash) – Charge dynamics in photovoltaic polymers.- III. Functional probing of biosystems and macromolecules: Dani Muller (Basel) – Molecular Imaging of biomembranes single molecules with electrically functionalized probes.- F. Sachs (SUNY)– AFM/patch clamp in biology.- J. Hafner – Electrical imaging of membranes.- T. Shaeffer/I. Kornev – Cell dynamics by Ion conductance microscopy.- M. Fujihira (U. Tokyo)/H.Yamada (Osaka U)– Ferroelectric polymers.- IV. SPM of magnetic materials: Andreas Heinrich (IBM-Almaden) – Spin manipulation by STM.- Rafi Budakian (Cornell)/Jon Rugar (IBM Almaden)– Magnetic Resonant Force Microscopy.- P. Grutter/R. Proksch – Magnetic Force Microscopy.- V. Electromechanics on the nanoscale: ferroelectrics and multiferroics: S. Kalinin/S. Jesse/R. Proksch (Asylum Research) – New dynamic modes and energy dissipation in SPM.- A. Kholkin (U. Aveiro) – Polarization dynamics in relaxor ferroelectrics.- B.J. Rodriguez /M. Alexe/S. Kalinin– Piezoresponse Force Spectroscopy.- A. Gruverman (UNL) – Polarization dynamics in capacitors and heterostructures.- VI. Mechanical properties: D. Hurley (NIST) – Nanomechanics by SPM.- U. Rabe and W. Arnold – Atomic Force Acoustic Microscopy of functional materials.- VII. Optical methods: L. Novotny (Rochester)– NSOM and NSOM-transport.- H. Hallen (NCSU) – NSOM.- H. Gaub – Optical machines and unfolding.- A. Sugawara – Optically-assisted pump-probe STM.- VIII. Emerging SPM applications: M. Tomitori - STM/NC-AFM.- Yasuo Cho (Tohoku) - Scanning Non-linear Dielectric Microscopy.- Maki Kawai – Vibrational spectroscopy of single molecule.- P. Weiss/Ekinchi – Ultrafast ac STM.- O. Lourie (Nanofactory)– SPM and electron microscopy combined.- O. Warren/T. Wyrobeck (Hysitron) - In-situ STEM-nanoindentation.- M. Bode/V. Rose/S. Streiffer (Argonne) – Material characterization by SPM-focused X-ray combination.
Notă biografică
Sergei Kalinin is a researcher at Oak Ridge National Laboratory.Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.
Textul de pe ultima copertă
Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.Key Features:•Serves the rapidly developing field of nanoscale characterization of functional materials properties•Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors•Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations•Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization
Caracteristici
Serves the rapidly developing field of nanoscale characterization of functional materials properties
Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors
Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations
Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization
Includes supplementary material: sn.pub/extras
Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors
Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations
Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization
Includes supplementary material: sn.pub/extras