Semiconductor Silicon: Materials Science and Technology: Springer Series in Materials Science, cartea 13
Editat de Günther Harbeke, Max J. Schulzen Limba Engleză Paperback – 16 dec 2011
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Specificații
ISBN-13: 9783642747250
ISBN-10: 3642747256
Pagini: 360
Ilustrații: IX, 345 p.
Dimensiuni: 155 x 235 x 19 mm
Greutate: 0.5 kg
Ediția:Softcover reprint of the original 1st ed. 1989
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Materials Science
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642747256
Pagini: 360
Ilustrații: IX, 345 p.
Dimensiuni: 155 x 235 x 19 mm
Greutate: 0.5 kg
Ediția:Softcover reprint of the original 1st ed. 1989
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Materials Science
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
I Crystal Growth.- Czochralski Growth of Silicon.- Chemical and Physical Considerations in the Chemical Vapor Deposition Process.- Silicon Molecular Beam Epitaxy (Si-MBE).- II Processing.- Simulation of Silicon Processing.- Simulation of Laser-Assisted Doping of Silicon — The Temperature Distribution.- Ion Implantation.- Low Temperature Epitaxial Crystallization of Amorphous Si by Ion-Beam Irradiation.- On the Generation of Ripples on Silicon.- III Defects.- Theory of Defects in Crystalline Silicon.- Defects in CZ Silicon.- Tellurium Related Deep Traps in Silicon.- IV Characterization Methods.- High Resolution Electron Microscopy of Defects in Silicon.- Tunneling Microscopy and Surface Analysis.- Scanning Minority Carrier Transient Spectroscopy: A Method to Investigate the Lateral Distribution of Defects in Semiconductors.- Optical Characterization of Silicon Materials and Structures.- Oxygen-Free Silicon; How Does IR See It?.- V Insulating Films.- Characterization of the SiO2-Si Interface.- Advanced Silicon on Insulator Materials: Processing, Characterization and Devices.- VI Silicide Films.- Properties of Transition Metal Silicides.- State Density Gap in Ti-Silicide/p-Si/p+Si Schottky Barriers.- Morphology and Structure of Thin TiSi2 Films on Silicon.- Modelling Diffusion in Silicides.- VII Devices.- 4 Mbit Technology.- Technology and Reliability Problems of Trench Cell Capacitors.- Heavy Doping Effects and Their Influence on Silicon Bipolar Transistors.- Ionizing Radiation Effects in MOS Devices.- Crystalline Silicon Solar Cells.- Index of Contributors.