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Strain Effect in Semiconductors: Theory and Device Applications de Yongke Sun

Strain Effect in Semiconductors: Theory and Device Applications

Autor Yongke Sun, Scott E. Thompson, Toshikazu Nishida
en Limba Engleză Paperback – 20 noi 2014
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.
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Specificații

ISBN-13: 9781489983152
ISBN-10: 1489983155
Pagini: 364
Ilustrații: XII, 350 p.
Dimensiuni: 155 x 235 x 19 mm
Greutate: 0.51 kg
Ediția:2010
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Professional/practitioner

Cuprins

Overview: The Age of Strained Devices.- Band Structures of Strained Semiconductors.- Stress, Strain, Piezoresistivity, and Piezoelectricity.- Strain and Semiconductor Crystal Symmetry.- Band Structures of Strained Semiconductors.- Low-Dimensional Semiconductor Structures.- Transport Theory of Strained Semiconductors.- Semiconductor Transport.- Strain in Semiconductor Devices.- Strain in Electron Devices.- Piezoresistive Strain Sensors.- Strain Effects on Optoelectronic Devices.

Textul de pe ultima copertă

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also:
  • Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals
  • Explain strain physics relevant to logic devices as well as strain-based MEMS
This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.
 

Caracteristici

Provides industry relevant applications for strained CMOS technology Discusses range of applications from planar (2D) to nano-wire (1D) devices Treats strain physics at both qualitative overview level as well as detailed fundamental physics Explains strain physics relevant to logic devices as well as strain-based MEMS Sensors and strain in optoelectronic devices Includes supplementary material: sn.pub/extras