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The Boundary-Scan Handbook

Autor Kenneth P. Parker
en Limba Engleză Paperback – 3 mar 2013
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the integrated circuit (IC) level that allow software to alleviate the growing cost of designing and producing digital systems. The primary benefit of the standard is its ability to transform extremely printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily and swiftly deal with. The Boundary-Scan Handbook is for professionals in the electronics industry who are concerned with the practical problems of competing successfully in the face of rapid-fire technological change. Since many of these changes affect our ability to do testing and hence cost-effective production, the advent of the 1149.1 standard is rightly looked upon as a major breakthrough. However, there is a great deal of misunderstanding about what to expect of 1149.1 and how to use it. Because of this, The Boundary-Scan Handbook is not a rehash of the 1149.1 standard, nor does it intend to be a tutorial on the basics of its workings. The standard itself should always be consulted for this, being careful to follow supplements issued by the IEEE that clarify and correct it. Rather, The Boundary-Scan Handbook motivates proper expectations and explains how to use the standard successfully.
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Specificații

ISBN-13: 9781475721447
ISBN-10: 1475721447
Pagini: 284
Ilustrații: XVII, 262 p. 4 illus.
Dimensiuni: 155 x 235 x 15 mm
Greutate: 0.4 kg
Ediția:1992
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States

Public țintă

Research

Cuprins

Boundary-Scan Basics and Vocabulary.- Boundary-Scan Description Language (BSDL).- Boundary-Scan Testing.- Advanced Boundary-Scan Testing.- Design for Boundary-Scan Testing.- The Future of Boundary-Scan.

Recenzii

"This is a well-written book that will take some of the mystery out of boundary scan. Those getting involved with boundary scan will find it both useful and interesting." D. Romanchik in Test & Measurement World, November 1992
'I greatly enjoyed reading this book. In it, Ken Parker presents a highly practical view of IEEE std. 1149.1 and the ways in which boundary scan can be used to achieve real business benefits. The book provides an excellent introduction to boundary scan technology for the novice, to whom I strongly recommend it. It also provides an entertaining and refreshing view of boundary-scan for those with more experience.' IEEE Design & test of Computers 10:1 1993
'... this book will become essential reading over the next few years by anybody who needs to understand the basics of boundary scan and its practical implementation in industry.' Microprocessors and Microsystems 17:5 1993

Notă biografică

Dr. Kenneth P. Parker received his PHD at Stanford University. He has recently retired from a career with Hewlett-Packard and Agilent Technologies in the field of testing of electrical assemblies.

Textul de pe ultima copertă

Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.

Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers;
 
Explains the new IEEE 1149.8.1 subsidiary standard and applications;
 
Describes the latest updates on the supplementary IEEE testing standards.

In particular, addresses:

IEEE Std 1149.1                      Digital Boundary-Scan
IEEE Std 1149.4                      Analog Boundary-Scan
IEEE Std 1149.6                      Advanced I/O Testing
IEEE Std 1149.8.1                    Passive Component Testing
IEEE Std 1149.1-2013                 The
2013 Revision of 1149.1
IEEE Std 1532                        In-System Configuration
IEEE Std 1149.6-2015                 The 2015 Revision of 1149.6

Caracteristici

Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers Explains the new IEEE 1149.8.1 subsidiary standard and applications Describes the latest updates on the supplementary IEEE testing standards