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Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications de Andrei Benediktovich

Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: Springer Series in Materials Science, cartea 183

Autor Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov
en Limba Engleză Hardback – 18 sep 2013
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
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Specificații

ISBN-13: 9783642381768
ISBN-10: 3642381766
Pagini: 332
Ilustrații: XIII, 318 p. 108 illus., 37 illus. in color.
Dimensiuni: 155 x 235 x 23 mm
Greutate: 0.52 kg
Ediția:2014
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Materials Science

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

Basic principles of the interaction between X-rays and matter.- X-ray reflectivity.- High-resolution X-ray diffraction.- Grazing-incidence small-angle X-ray scattering.- Theory of X-ray scattering from imperfect crystals.- X-ray diffraction for evaluation of residual stresses in polycrystals.- Methods of mathematical and physical optimization of X-ray data analysis.

Notă biografică

Andrey Benediktovich is working at the department of Theoretical Physics, Belarusian State University, Minsk, Belarus. Since several years he takes a part in joint projects with Bruker AXS, which are dedicated to the development of modern analytical methods for X-ray data analysis. He also collaborates with Siegen University (Germany) for theoretical simulation of the X-ray diffraction processes occured at X-ray Free Electron Lasers.
Ilya Feranchuk is a Chair and Professor of the Theoretical Physics Department at Belarusian State University. He recieved his PhD (1975) and DSc (1985) in theoretical physics at the same university. In the early seventies he was a first discover of the parametric X-ray radiation, and next decades was involved in studies on this effect. In 2002 he was awarded by a State Prize of Belarus for investigation of PXR. Last decade he is focused on analytical X-ray scattering methods (HRXRD, XRR, GISAXS, etc) used in modern nanoscience and semiconductor industries as well as conducts the fundamental researches of interaction of X-rays with crystalline, polycrystalline and amorphous materials.
Alex Ulyanenkov received his PhD (1991, title “Operator method for description of quantum systems in periodic fields”) and D.Sc. (2007, title: "Non-perturbative methods for microscopic description of coherent processes during the interaction of charged particles and x-rays with crystals and nanostructures") in Physics from Belarusian State University. His present scientific activity includes the studies of X-ray scattering from nanostructures, thin solid films, semiconductor multilayers and superlattices, porous matter, largemolecules and proteins. He is Managing Director of Rigaku Europe SE, the part of Rigaku Corporation, one of the world leaders in the production of X-ray analytical instruments. Within the recent decades, he was working at Potsdam University, later at Science University of Tokyo, Japan, and for Bruker AXS GmbH.

Textul de pe ultima copertă

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Caracteristici

Gives a state-of-the-art report of the understanding of X-ray scattering and diffraction Contains theoretical methods for a wide range of X-ray materials research Includes detailed explanations of theoretical models and approaches Includes supplementary material: sn.pub/extras