Ultrafast Dynamical Processes in Semiconductors: Topics in Applied Physics, cartea 92
Editat de Kong-Thon Tsenen Limba Engleză Hardback – 25 feb 2004
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Specificații
ISBN-13: 9783540402398
ISBN-10: 354040239X
Pagini: 416
Ilustrații: XI, 400 p.
Dimensiuni: 155 x 235 x 28 mm
Greutate: 0.76 kg
Ediția:2004
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Topics in Applied Physics
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 354040239X
Pagini: 416
Ilustrații: XI, 400 p.
Dimensiuni: 155 x 235 x 28 mm
Greutate: 0.76 kg
Ediția:2004
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Topics in Applied Physics
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Terahertz Radiation from Semiconductors.- Ultrafast Scanning Tunneling Microscopy: Principles and Applications.- Ultrafast Coherent Dynamics in Semiconductor Quantum Dots.- Spontaneous Emission from Semiconductors after Ultrafast Pulse Excitation: Theory and Simulation.- Optical Studies of Electric-Field-Induced Electron and Hole Transient Transports and Optical Phonon Instability in Semiconductor Nanostructures.- Carrier Dynamics in III-Nitrides Studied by Time-Resolved Photoluminescence.- Femtosecond X-rays and Structural Dynamics in Condensed Matter.- Generation of Coherent Acoustic Phonons in Nitride-Based Semiconductor Nanostructures.
Textul de pe ultima copertă
An international team of experts describes the optical and electronic properties of semiconductors and semiconductor nanostructures at picosecond and femtosecond time scales. The contributions cover the latest research on a wide range of topics. In particular they include novel experimental techniques for studying and characterizing nanostructure materials. The contributions are written in a tutorial way so that not only researchers in the field but also researchers and graduate students outside the field can benefit.
Caracteristici
Presents the current state-of-the-art of ultrafast processes in semiconductors Reviews by leading experts Up-to-date-references