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VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers: IFIP Advances in Information and Communication Technology, cartea 483

Editat de Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis
en Limba Engleză Hardback – 13 sep 2016
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
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Specificații

ISBN-13: 9783319460963
ISBN-10: 331946096X
Pagini: 250
Ilustrații: XIII, 223 p. 121 illus.
Dimensiuni: 155 x 235 x 14 mm
Greutate: 0.51 kg
Ediția:1st ed. 2016
Editura: Springer International Publishing
Colecția Springer
Seria IFIP Advances in Information and Communication Technology

Locul publicării:Cham, Switzerland

Caracteristici

Includes supplementary material: sn.pub/extras