X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research: Springer Tracts in Modern Physics, cartea 148
Autor Metin Tolanen Limba Engleză Paperback – 3 oct 2013
Din seria Springer Tracts in Modern Physics
- 15% Preț: 635.31 lei
- 18% Preț: 869.40 lei
- 18% Preț: 935.90 lei
- 20% Preț: 814.68 lei
- 20% Preț: 816.03 lei
- 18% Preț: 1395.91 lei
- 18% Preț: 769.65 lei
- Preț: 401.40 lei
- Preț: 419.69 lei
- Preț: 417.77 lei
- Preț: 379.59 lei
- Preț: 379.42 lei
- Preț: 373.56 lei
- Preț: 371.10 lei
- Preț: 375.26 lei
- Preț: 376.76 lei
- Preț: 374.69 lei
- Preț: 379.59 lei
- Preț: 383.53 lei
- Preț: 372.98 lei
- Preț: 378.26 lei
- 18% Preț: 866.16 lei
- Preț: 378.26 lei
- Preț: 377.51 lei
- Preț: 376.02 lei
- Preț: 370.36 lei
- Preț: 369.62 lei
- Preț: 370.36 lei
- Preț: 376.97 lei
- Preț: 374.30 lei
- Preț: 383.74 lei
- Preț: 372.06 lei
- Preț: 376.97 lei
- Preț: 383.53 lei
- Preț: 371.32 lei
- Preț: 372.60 lei
- Preț: 369.78 lei
- Preț: 374.89 lei
- Preț: 376.60 lei
- Preț: 373.56 lei
- Preț: 380.17 lei
- Preț: 373.76 lei
- Preț: 376.76 lei
- Preț: 378.46 lei
- 18% Preț: 1200.14 lei
Preț: 623.45 lei
Preț vechi: 733.47 lei
-15% Nou
Puncte Express: 935
Preț estimativ în valută:
119.32€ • 123.94$ • 99.11£
119.32€ • 123.94$ • 99.11£
Carte tipărită la comandă
Livrare economică 03-17 februarie 25
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9783662142189
ISBN-10: 366214218X
Pagini: 212
Ilustrații: IX, 198 p. 28 illus.
Dimensiuni: 155 x 235 x 11 mm
Greutate: 0.3 kg
Ediția:Softcover reprint of the original 1st ed. 1999
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Tracts in Modern Physics
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 366214218X
Pagini: 212
Ilustrații: IX, 198 p. 28 illus.
Dimensiuni: 155 x 235 x 11 mm
Greutate: 0.3 kg
Ediția:Softcover reprint of the original 1st ed. 1999
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Tracts in Modern Physics
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.
Recenzii
"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."
Physics Today, 2000/2
Physics Today, 2000/2
Textul de pe ultima copertă
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Caracteristici
Comprehensive introduction to the state of the art of this rapidly growing research field.