X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research: Springer Tracts in Modern Physics, cartea 148
Autor Metin Tolanen Limba Engleză Paperback – 3 oct 2013
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Specificații
ISBN-13: 9783662142189
ISBN-10: 366214218X
Pagini: 212
Ilustrații: IX, 198 p. 28 illus.
Dimensiuni: 155 x 235 x 11 mm
Greutate: 0.3 kg
Ediția:Softcover reprint of the original 1st ed. 1999
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Tracts in Modern Physics
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 366214218X
Pagini: 212
Ilustrații: IX, 198 p. 28 illus.
Dimensiuni: 155 x 235 x 11 mm
Greutate: 0.3 kg
Ediția:Softcover reprint of the original 1st ed. 1999
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Tracts in Modern Physics
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.
Recenzii
"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."
Physics Today, 2000/2
Physics Today, 2000/2
Textul de pe ultima copertă
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Caracteristici
Comprehensive introduction to the state of the art of this rapidly growing research field.