Cantitate/Preț
Produs
Total produse
Vezi coșul
Design, Analysis and Test of Logic Circuits Under Uncertainty de Smita Krishnaswamy

Design, Analysis and Test of Logic Circuits Under Uncertainty: Lecture Notes in Electrical Engineering, cartea 115

Autor Smita Krishnaswamy, Igor L. Markov, John P. Hayes
en Limba Engleză Paperback – 15 oct 2014
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Citește tot Restrânge

Toate formatele și edițiile

Toate formatele și edițiile Preț Express
Paperback (1) 61444 lei  6-8 săpt.
  SPRINGER NETHERLANDS – 15 oct 2014 61444 lei  6-8 săpt.
Hardback (1) 62015 lei  6-8 săpt.
  SPRINGER NETHERLANDS – 21 sep 2012 62015 lei  6-8 săpt.

Din seria Lecture Notes in Electrical Engineering

Preț: 61444 lei

Preț vechi: 72287 lei
-15% Nou

Puncte Express: 922
Preț estimativ în valută:
11758€ • 12367$ • 9825£

Carte tipărită la comandă

Livrare economică 08-22 ianuarie 25

 Adaugă în coș

Wish list
Gift list
Am citit!
Adaugă în listă
Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9789400797987
ISBN-10: 9400797982
Pagini: 136
Ilustrații: XII, 124 p.
Dimensiuni: 155 x 235 x 7 mm
Greutate: 0.2 kg
Ediția:2013
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria Lecture Notes in Electrical Engineering

Locul publicării:Dordrecht, Netherlands

Public țintă

Research

Cuprins

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.

Textul de pe ultima copertă

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits.  The book describes techniques for:
 
• Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework;
 
• Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations;
 
• Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance;
 
• Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.

Caracteristici

Presents a comprehensive overview of Logic Circuits Combines theory with practical examples Multi-discipline approach to the "hot" topic of uncertainty Includes supplementary material: sn.pub/extras