Design and Test of Integrated Inductors for RF Applications
Autor Jaime Aguilera, Roc Berengueren Limba Engleză Paperback – 19 noi 2010
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Specificații
ISBN-13: 9781441954114
ISBN-10: 1441954112
Pagini: 212
Ilustrații: XXII, 188 p.
Dimensiuni: 155 x 235 x 11 mm
Greutate: 0.3 kg
Ediția:2003
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1441954112
Pagini: 212
Ilustrații: XXII, 188 p.
Dimensiuni: 155 x 235 x 11 mm
Greutate: 0.3 kg
Ediția:2003
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
Dedication.- List of Figures.- List of Tables.- List of Abbreviations.- Preface.-
1: Introduction. 1. Conventional IC fabrication technologies. 2. Keys to progress in RF transceiver design: High Q integrated inductors. 3. The challenge of integrating high quality inductors. 4. Structure of the book.- 2: General considerations. 1. Ways of of integrating an inductor. 2. Spiral inductors on silicon based technologies.- 3: Inductor's test and characterization. 1. On wafer measuring equipment. 2. Measuring accuracy and repeatability. 3. Measuring configuration: 1-port versus 2-port configuration. 4. Test fixture design. 5. De-embedding techniques. 6. Pi model inductor characterization.- 4: Influence of the geometric parameters on the inductor's performance: Design rules. 1. Problem description. 2. Analytical study and simulations. 3. Empirical study. 4. Design considerations.- 5: Inductor's design flow. 1. Generation phase. 2. Filtering phase. 3. Performance estimation phase. 4. Verification phase.- Appendix.- References.- Index.
1: Introduction. 1. Conventional IC fabrication technologies. 2. Keys to progress in RF transceiver design: High Q integrated inductors. 3. The challenge of integrating high quality inductors. 4. Structure of the book.- 2: General considerations. 1. Ways of of integrating an inductor. 2. Spiral inductors on silicon based technologies.- 3: Inductor's test and characterization. 1. On wafer measuring equipment. 2. Measuring accuracy and repeatability. 3. Measuring configuration: 1-port versus 2-port configuration. 4. Test fixture design. 5. De-embedding techniques. 6. Pi model inductor characterization.- 4: Influence of the geometric parameters on the inductor's performance: Design rules. 1. Problem description. 2. Analytical study and simulations. 3. Empirical study. 4. Design considerations.- 5: Inductor's design flow. 1. Generation phase. 2. Filtering phase. 3. Performance estimation phase. 4. Verification phase.- Appendix.- References.- Index.