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Dislocations and Deformation Mechanisms in Thin Films and Small Structures: Volume 673: MRS Proceedings

Editat de Oliver Kraft, Klaus W. Schwarz, Shefford P. Baker, L. Ben Freund, Robert Hull
en Limba Engleză Hardback – 19 sep 2001
The mechanical properties of small volumes of materials such as thin films and patterned structures can be very different from the mechanical properties of those same materials in bulk. Many explanations of the mechanical behaviors of such small volumes have depended on simplified models of dislocation behavior. However, recent developments in dislocation modeling have made it possible to understand dislocation behavior in much more detail than before. A wide range of topics is presented in these proceedings, including mechanisms of plastic deformation in heteroepitaxial, multilayered and polycrystalline thin films, as well as three-dimensional mesostructures such as epitaxial islands, semiconducting devices and microcrystallites. Experimental, theoretical and numerical simulations are addressed. Topics include: dislocation and deformation mechanisms in thin metal films and multilayers; discrete dislocations - observations and simulations; dislocations and deformation mechanisms in thin films and small structures; dislocations in small structures; dislocations and deformation in epitaxial layers; dislocation fundamentals -observations, calculations and simulations.
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Specificații

ISBN-13: 9781558996090
ISBN-10: 1558996095
Pagini: 248
Dimensiuni: 152 x 228 x 18 mm
Greutate: 0.45 kg
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria MRS Proceedings

Locul publicării:New York, United States

Cuprins

Part I. Dislocation and Deformation Mechanisms in Thin Metal Films and Multilayers I; Part II. Discrete Dislocations: Observations and Simulations; Part III. Dislocations and Deformation Mechanisms in Thin Films and Small Structures; Part IV. Dislocations in Small Structures; Part V. Dislocations and Deformation in Epitaxial Layers; Part VI. Dislocation Fundamentals: Observations, Calculations and Simulations; Part VII. Dislocations and Deformation Mechanisms in Thin Metal Films and Multilayers II; Author index; Subject index.

Descriere

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.