High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip: Computer Architecture and Design Methodologies
Autor Zheng Wang, Anupam Chattopadhyayen Limba Engleză Hardback – 5 iul 2017
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Toate formatele și edițiile | Preț | Express |
---|---|---|
Paperback (1) | 612.56 lei 6-8 săpt. | |
Springer Nature Singapore – 12 mai 2018 | 612.56 lei 6-8 săpt. | |
Hardback (1) | 618.53 lei 6-8 săpt. | |
Springer Nature Singapore – 5 iul 2017 | 618.53 lei 6-8 săpt. |
Preț: 618.53 lei
Preț vechi: 727.68 lei
-15% Nou
Puncte Express: 928
Preț estimativ în valută:
118.38€ • 124.88$ • 98.65£
118.38€ • 124.88$ • 98.65£
Carte tipărită la comandă
Livrare economică 02-16 ianuarie 25
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9789811010729
ISBN-10: 9811010722
Pagini: 197
Ilustrații: XX, 197 p. 104 illus., 72 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.49 kg
Ediția:1st ed. 2018
Editura: Springer Nature Singapore
Colecția Springer
Seria Computer Architecture and Design Methodologies
Locul publicării:Singapore, Singapore
ISBN-10: 9811010722
Pagini: 197
Ilustrații: XX, 197 p. 104 illus., 72 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.49 kg
Ediția:1st ed. 2018
Editura: Springer Nature Singapore
Colecția Springer
Seria Computer Architecture and Design Methodologies
Locul publicării:Singapore, Singapore
Cuprins
Introduction.- Background.- Related Work.- High-level Fault Injection and Simulation.- Architectural Reliability Estimation.- Architectural Reliability Exploration.- System-level Reliability Exploration.- Conclusion and Outlook.
Notă biografică
Dr.-Ing. Zheng Wang earned the Bachelor degree in physics from Shanghai Jiao Tong University (SJTU), China and Master degree in Electronic Engineering from Technische Universität München (TUM), Germany. From 2008 till 2009, he worked in the mobile sector of Infineon Technologies AG in Munich (currently Intel Mobile Communications). In 2010 he joined as a research associate in the Institute for Communication Technologies and Embedded Systems (ICE) of RWTH-Aachen University, Germany, where he obtained the PhD (Dr.-Ing.) in the year 2015. From 2015 till 2016, he worked in the Bio-inspired Reconfigurable Analog INtegrated (BRAIN) Systems Lab, Nanyang Technological University, Singapore in the field of neuromorphic ASIC and hardware security. In 2017 he joined the Center for Automotive Electronics, Shenzhen Institutes of Advanced Technology as an Assistant Professor.
Dr.-Ing. Wang's research interests include the design of digital processor and system, low
Textul de pe ultima copertă
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Caracteristici
Offers a systematic approach to high-level reliability estimation and exploration Presents step-by-step procedures for 11 novel techniques and solutions Includes more than 100 figures and illustrations Includes supplementary material: sn.pub/extras